Measurement of scratch-induced residual stress within SiC grains in ZrB2-SiC composite using micro-Raman spectroscopy

Acta Materialia

Volumn 56, Issue 18, 2008, Pages 5345-5354

  Ghosh, Dipankar ^a   Subhash, Ghatu ^a   Orlovskaya, Nina ^b  

^a UNIVERSITY OF FLORIDA   (United States)

^b University of Central Florida   (United States)

Author keywords

Borides; Ceramic matrix composite; Raman spectroscopy; Residual stress; Scratch test

Indexed keywords

RESIDUAL STRESSES; STRENGTH OF MATERIALS;

BORIDES; CERAMIC MATRIX COMPOSITE; RAMAN SPECTROSCOPY; RESIDUAL STRESS; SCRATCH TEST; SIC GRAINS;

SILICON CARBIDE;

EID: 53049084158     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2008.07.031     Document Type: Article

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