-
1
-
-
52649152634
-
-
J. M. Koo, B. S. Seo, S. Kim, S. Shin, J. H. Lee, H. Baik, J. H. Lee, J. H. Lee, B. J. Bae, J. E. Lim, Tech. Dig.-Int. Electron Devices Meet., 2005, 4.
-
Tech. Dig. - Int. Electron Devices Meet.
, vol.2005
, pp. 4
-
-
Koo, J.M.1
Seo, B.S.2
Kim, S.3
Shin, S.4
Lee, J.H.5
Baik, H.6
Lee, J.H.7
Lee, J.H.8
Bae, B.J.9
Lim, J.E.10
-
2
-
-
35549000100
-
-
T. Watanabe, S. Hoffmann-Eifert, F. Peter, S. Mi, C. Jia, C. S. Hwang, and R. Waser, J. Electrochem. Soc., 154, G262 (2007).
-
(2007)
J. Electrochem. Soc.
, vol.154
, pp. 262
-
-
Watanabe, T.1
Hoffmann-Eifert, S.2
Peter, F.3
Mi, S.4
Jia, C.5
Hwang, C.S.6
Waser, R.7
-
3
-
-
0035842769
-
-
S. R. Summerfelt, T. S. Moise, G. Xing, L. Colombo, T. Sakoda, S. R. Gilbert, A. L. S. Loke, S. Ma, L. A. Wills, R. Kavari, Appl. Phys. Lett., 79, 4004 (2001).
-
(2001)
Appl. Phys. Lett.
, vol.79
, pp. 4004
-
-
Summerfelt, S.R.1
Moise, T.S.2
Xing, G.3
Colombo, L.4
Sakoda, T.5
Gilbert, S.R.6
Loke, A.L.S.7
Ma, S.8
Wills, L.A.9
Kavari, R.10
-
4
-
-
33846319057
-
-
T. Watanabe, S. Hoffmann-Eifert, C. S. Hwang, and R. Waser, Mater. Res. Soc. Symp. Proc., 902E, 0902-T04-07.1 (2006).
-
(2006)
Mater. Res. Soc. Symp. Proc.
, vol.902
-
-
Watanabe, T.1
Hoffmann-Eifert, S.2
Hwang, C.S.3
Waser, R.4
-
5
-
-
52649095525
-
-
in, ISAF
-
T. Watanabe, S. Hoffmann-Eifert, R. Waser, and C. S. Hwang, in Applications of Ferroelectrics, ISAF, pp. 89-92 (2006).
-
(2006)
Applications of Ferroelectrics
, pp. 89-92
-
-
Watanabe, T.1
Hoffmann-Eifert, S.2
Waser, R.3
Hwang, C.S.4
-
6
-
-
34547159401
-
-
T. Watanabe, S. Hoffmann-Eifert, L. Yang, A. Rüdiger, C. Kügeler, C. S. Hwang, and R. Waser, J. Electrochem. Soc., 154, G134 (2007).
-
(2007)
J. Electrochem. Soc.
, vol.154
, pp. 134
-
-
Watanabe, T.1
Hoffmann-Eifert, S.2
Yang, L.3
Rüdiger, A.4
Kügeler, C.5
Hwang, C.S.6
Waser, R.7
-
7
-
-
34547188279
-
-
O. S. Kwon, S. W. Lee, J. H. Han, and C. S. Hwang, J. Electrochem. Soc., 154, G127 (2007).
-
(2007)
J. Electrochem. Soc.
, vol.154
, pp. 127
-
-
Kwon, O.S.1
Lee, S.W.2
Han, J.H.3
Hwang, C.S.4
-
8
-
-
52649156602
-
-
International Centre for Diffraction Data, ICDD no. 06-0452.
-
International Centre for Diffraction Data, ICDD no. 06-0452.
-
-
-
-
9
-
-
52649174418
-
-
International Centre for Diffraction Data, ICDD no. 33-0784.
-
International Centre for Diffraction Data, ICDD no. 33-0784.
-
-
-
-
10
-
-
2942559048
-
-
R. W. Schwartz, T. Schneller, and R. Waser, C. R. Chim., 7, 433 (2004).
-
(2004)
C. R. Chim.
, vol.7
, pp. 433
-
-
Schwartz, R.W.1
Schneller, T.2
Waser, R.3
-
11
-
-
0036557750
-
-
R. W. Whatmore, Q. Zhang, Z. Huang, and R. A. Dorey, Mater. Sci. Semicond. Process., 5, 65 (2003).
-
(2003)
Mater. Sci. Semicond. Process.
, vol.5
, pp. 65
-
-
Whatmore, R.W.1
Zhang, Q.2
Huang, Z.3
Dorey, R.A.4
-
12
-
-
20344391143
-
-
A. Nagai, G. Asano, J. Minamidate, C. J. Choi, C.-R. Cho, Y. Park, and H. Funakubo, Mater. Res. Soc. Symp. Proc., 830, D2.2 (2005).
-
(2005)
Mater. Res. Soc. Symp. Proc.
, vol.830
, pp. 22
-
-
Nagai, A.1
Asano, G.2
Minamidate, J.3
Choi, C.J.4
Cho, C.-R.5
Park, Y.6
Funakubo, H.7
-
13
-
-
0036805321
-
-
C. S. Hwang, S. Y. No, J. Park, H. J. Kim, H. J. Cho, Y. K. Han, and K. Y. Oh, J. Electrochem. Soc., 149, G585 (2002).
-
(2002)
J. Electrochem. Soc.
, vol.149
, pp. 585
-
-
Hwang, C.S.1
No, S.Y.2
Park, J.3
Kim, H.J.4
Cho, H.J.5
Han, Y.K.6
Oh, K.Y.7
-
14
-
-
0029358255
-
-
C. D. E. Lakeman, Z. Xu, and D. A. Payne, J. Mater. Res., 10, 2042 (1995).
-
(1995)
J. Mater. Res.
, vol.10
, pp. 2042
-
-
Lakeman, C.D.E.1
Xu, Z.2
Payne, D.A.3
-
15
-
-
10644230897
-
-
Z. Cao, A. Ding, X. He, W. Cheng, and P. Qiu, J. Cryst. Growth, 273, 498 (2005).
-
(2005)
J. Cryst. Growth
, vol.273
, pp. 498
-
-
Cao, Z.1
Ding, A.2
He, X.3
Cheng, W.4
Qiu, P.5
|