What aligns liquid crystals on solid substrates? The role of surface roughness anisotropy

Physical Review Letters

Volumn 94, Issue 7, 2005, Pages

  Kumar, Satyendra ^a   Kim, Jae Hoon ^a,b   Shi, Yushan ^a  

^a KENT STATE UNIVERSITY   (United States)

^b Hanyang University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ANCHORING ENERGIES; COHERENCE LENGTHS; GAUSSIAN DISTRIBUTION; SCATTERING PLANES;

ANISOTROPY; ATOMIC FORCE MICROSCOPY; MORPHOLOGY; SUBSTRATES; SURFACE ROUGHNESS; THIN FILMS; VECTORS; X RAY ANALYSIS;

LIQUID CRYSTALS;

EID: 18144381032     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.94.077803     Document Type: Article

References (23)

1. C. Mauguin, Bull. Soc. Fr. Mineral. 34, 71 (1911); J. Cognard, Mol. Cryst. Liq. Cryst., Suppl. Ser. 1, 1 (1982).
2. C. Mauguin, Bull. Soc. Fr. Mineral. 34, 71 (1911); J. Cognard, Mol. Cryst. Liq. Cryst., Suppl. Ser. 1, 1 (1982).
3. T. Seki et al., Macromolecules 22, 3505 (1989).
4. J. L. Janning, Appl. Phys. Lett. 21, 173 (1972).
5. M. Schadt, H. Seiberle, and A. Schuster, Nature (London) 381, 212 (1996); J.-H. Kim, Y. Shi, S.-D. Lee, and S. Kumar, Phys. Rev. E 57, 5644 (1998).
6. M. Schadt, H. Seiberle, and A. Schuster, Nature (London) 381, 212 (1996); J.-H. Kim, Y. Shi, S.-D. Lee, and S. Kumar, Phys. Rev. E 57, 5644 (1998).
7. Y. Reznikov et al., Phys. Rev. Lett. 84, 1930 (2000).
8. D. C. Flanders, D. C. Shaver, and H. I. Smith, Appl. Phys. Lett. 32, 597 (1978); R. R. Shah and N. L. Abbott, Science 293, 1296 (2001); J.-H. Kim, M. Yoneya, H. Yokoyama, Nature (London) 420, 159 (2002).
9. D. C. Flanders, D. C. Shaver, and H. I. Smith, Appl. Phys. Lett. 32, 597 (1978); R. R. Shah and N. L. Abbott, Science 293, 1296 (2001); J.-H. Kim, M. Yoneya, H. Yokoyama, Nature (London) 420, 159 (2002).
10. D. C. Flanders, D. C. Shaver, and H. I. Smith, Appl. Phys. Lett. 32, 597 (1978); R. R. Shah and N. L. Abbott, Science 293, 1296 (2001); J.-H. Kim, M. Yoneya, H. Yokoyama, Nature (London) 420, 159 (2002).
11. D. W. Berreman, Phys. Rev. Lett. 28, 1683 (1972); Mol. Cryst. Liq. Cryst. 23, 215 (1973); P. Patrício et al., Phys. Rev. Lett. 88, 245502 (2002).
12. D. W. Berreman, Phys. Rev. Lett. 28, 1683 (1972); Mol. Cryst. Liq. Cryst. 23, 215 (1973); P. Patrício et al., Phys. Rev. Lett. 88, 245502 (2002).
13. D. W. Berreman, Phys. Rev. Lett. 28, 1683 (1972); Mol. Cryst. Liq. Cryst. 23, 215 (1973); P. Patrício et al., Phys. Rev. Lett. 88, 245502 (2002).
14. J. M. Geary, J. W. Goodby, A. R. Kmetz, and J. S. Patel, J. Appl. Phys. 62, 4100 (1987); D.-S. Seo et al., Mol. Cryst. Liq. Cryst. 231, 95 (1993).
15. J. M. Geary, J. W. Goodby, A. R. Kmetz, and J. S. Patel, J. Appl. Phys. 62, 4100 (1987); D.-S. Seo et al., Mol. Cryst. Liq. Cryst. 231, 95 (1993).
16. J. Stohr et al., Macromolecules 31, 1942 (1998).
17. M. F. Toney et al., Nature (London) 374, 709 (1995).
18. W. Chen, M. B. Feller, and Y. R. Shen, Phys. Rev. Lett. 63, 2665 (1989).
19. B. Cull, Y. Shi, M. Schadt, and S. Kumar, Phys. Rev. E 53, 3777 (1996); B. E. Warren, X-ray Diffraction (Dover, New York, 1969).
20. B. Cull, Y. Shi, M. Schadt, and S. Kumar, Phys. Rev. E 53, 3777 (1996); B. E. Warren, X-ray Diffraction (Dover, New York, 1969).
21. M. Schadt, K. Schmitt, V. Kozinkov, and V. Chigrinov, Jpn. J. Appl. Phys. 31, 2155 (1992).
22. K. Ha and J. L. West, Liq. Cryst. 31, 753 (2004).
23. Y. Sato, K. Sato, and T. Uchida, Jpn. J. Appl. Phys. 31, L579 (1992).