Anisotropic wetting on tunable micro-wrinkled surfaces

Soft Matter

Volumn 3, Issue 9, 2007, Pages 1163-1169

  Chung, Jun Young ^a   Youngblood, Jeffrey P ^b   Stafford, Christopher M ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b Purdue University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; ASPECT RATIO; MATHEMATICAL MODELS; SUBSTRATES; WETTING;

ANISOTROPIC WETTING; DROPLET WETTING ANISOTROPY; MICRO-WRINKLED SURFACES;

SURFACE ROUGHNESS;

EID: 34547917960     PISSN: 1744683X     EISSN: 17446848     Source Type: Journal    
DOI: 10.1039/b705112c     Document Type: Article

References (62)

1. R. N. Wenzel Ind. Eng. Chem. 1936 28 988 994
2. A. B. D. Cassie S. Baxter Trans. Faraday Soc. 1944 40 546 551
3. E. G. Shafrin W. A. Zisman Adv. Chem. Ser. 1964 43 145 157
4. J. Bico C. Marzolin D. Quéré Europhys. Lett. 1999 47 220 226
5. D. Öner T. J. McCarthy Langmuir 2000 16 7777 7782
6. A. Lafuma D. Quéré Nat. Mater. 2003 2 457 460
7. N. A. Patankar Langmuir 2003 19 1249 1253
8. C. W. Extrand Langmuir 2003 19 3793 3796
9. C. W. Extrand Langmuir 2005 21 10370 10374
10. M. Callies D. Quéré Soft Matter 2005 1 55 61
11. X. Feng L. Jiang Adv. Mater. 2006 18 3063 3078
12. L. Gao T. J. McCarthy Langmuir 2007 23 3762 3765
13. M. K. Chaudhury G. M. Whitesides Science 1992 256 1539 1541
14. J. Genzer K. Efimenko Science 2000 290 2130 2133
15. T. P. Russell Science 2002 297 964 967
16. S. Khongtong G. S. Ferguson J. Am. Chem. Soc. 2002 124 7254 7255
17. D. Julthongpiput M. J. Fasolka W. H. Zhang T. Nguyen E. J. Amis Nano Lett. 2005 5 1535 1540
18. H. G. Allen, Analysis and Design of Structural Sandwich Panels, Pergamon Press, Oxford, 1969
19. N. Bowden S. Brittain A. G. Evans J. W. Hutchinson G. M. Whitesides Nature 1998 393 146 149
20. A. L. Volynskii S. Bazhenov O. V. Lebedeva N. F. Bakeev J. Mater. Sci. 2000 35 547 554
21. J. Groenewold Physica A 2001 298 32 45
22. J. Genzer J. Groenewold Soft Matter 2006 2 310 323
23. E. P. Chan A. J. Crosby Soft Matter 2006 2 324 328
24. R. J. Good J. A. Kvikstad W. O. Bailey J. Colloid Interface Sci. 1971 35 314 327
25. Z. Yoshimitsu A. Nakajima T. Watanabe K. Hashimoto Langmuir 2002 18 5818 5822
26. Y. Chen B. He J. Lee N. A. Patankar J. Colloid Interface Sci. 2005 281 458 464
27. A. D. Sommers A. M. Jacobi J. Micromech. Microeng. 2006 16 1571 1578
28. Y. Zheng X. Gao L. Jiang Soft Matter 2007 3 178 182
29. Y. Zhao Q. Lu M. Li X. Li Langmuir 2007 23 6212 6217
30. A. Marmur J. Colloid Interface Sci. 1994 168 40 46
31. H. Gau S. Herminghaus P. Lenz R. Lipowsky Science 1999 283 46 49
32. M. Gleiche L. Chi E. Gedig H. Fuchs ChemPhysChem 2001 3 187 191
33. M. Morita T. Koga H. Otsuka A. Takahara Langmuir 2005 21 911 918
34. K. Efimenko M. Rackaitis E. Manias A. Vaziri L. Mahadevan J. Genzer Nat. Mater. 2005 4 293 297
35. C. M. Stafford C. Harrison K. L. Beers A. Karim E. J. Amis M. R. Vanlandingham H.-C. Kim W. Volksen R. D. Miller E. E. Simonyl Nat. Mater. 2004 3 545 550
36. C. M. Stafford S. Guo C. Harrison M. Y. M. Chiang Rev. Sci. Instrum. 2005 76 062207-1 062207-5
37. M. Ouyang C. Yuan R. J. Muisener A. Boulares J. T. Koberstein Chem. Mater. 2000 12 1591 1596
38. K. Efimenko W. E. Wallace J. Genzer J. Colloid Interface Sci. 2002 254 306 315
39. A. Olàh H. Hillborg G. J. Vancso Appl. Surf. Sci. 2005 239 410 423
40. For example, the surface height profile in Fig. 1c shows a buckling wavelength (λ) of ≈32 m and an amplitude (A) of ≈1.8 m, resulting in an aspect ratio (A/λ) of ≈0.056 (when ε = 20%). This aspect ratio of roughness coincides well with the theoretical value (≈0.063) obtained from eqn (4), setting εc ≈ 16% (which is determined by optical microscope images as well as contact-angle measurements; also see Fig. 2e). This result indicates that buckling-based technique can be easily utilized to obtain the precise surface-feature patterning
41. C. Harrison C. M. Stafford W. Zhang A. Karim Appl. Phys. Lett. 2004 85 4016 4018
42. H. Hillborg N. Tomczak A. Olàh H. Schönherr G. J. Vancso Langmuir 2004 20 785 794
43. J. Kim M. K. Chaudhury M. J. Owen IEEE Trans. Dielectr. Electr. Insul. 1999 6 695 702
44. J. Kim M. K. Chaudhury M. J. Owen J. Colloid Interface Sci. 2000 226 231 236
45. H. Hillborg U. W. Gedde IEEE Trans. Dielectr. Electr. Insul. 1999 6 703 717
46. J. Zhang X. Lu W. Huang Y. Han Macromol. Rapid Commun. 2005 26 477 480
47. X. Yu Z. Wang Y. Jiang F. Shi X. Zhang Adv. Mater. 2005 17 1289 1293
48. F. Xia L. Feng S. Wang T. Sun W. Song W. Jiang L. Jiang Adv. Mater. 2006 18 432 436
49. J. T. Han S. Kim A. Karim Langmuir 2007 23 2608 2614
50. W. Chen A. Y. Fadeev M. C. Hsieh D. Öner J. P. Youngblood T. J. McCarthy Langmuir 1999 15 3395 3399
51. R. Shuttleworth G. L. J. Bailey Discuss. Faraday Soc. 1948 3 16 22
52. R. E. Johnson, Jr. R. H. Dettre Adv. Chem. Ser. 1964 43 112 135
53. R. E. Johnson, Jr. R. H. Dettre J. Phys. Chem. 1964 68 1744 1750
54. R. E. Johnson, Jr. and R. H. Dettre, in Surface and Colloid Science, ed., E. Matijevic, Wiley-Interscience, New York, 1969, vol. 2, pp. 85-153
55. A. Marmur Soft Matter 2006 2 12 17
56. J. D. Eich R. J. Good A. W. Neumann J. Colloid Interface Sci. 1975 53 235 238
57. J. P. Youngblood, Ph.D. Thesis, University of Massachusetts Amherst, 2001
58. S. Herminghaus Europhys. Lett. 2000 52 165 170
59. L. Feng Y. Song J. Zhai B. Liu J. Xu L. Jiang D. Zhu Angew. Chem., Int. Ed. 2003 42 800 802
60. Q. Xie G. Fan N. Zhao X. Guo J. Xu J. Dong L. Zhang Y. Zhang C. C. Han Adv. Mater. 2004 16 1830 1833
61. M. E. Abdelsalam P. N. Bartlett T. Kelf J. Baumberg Langmuir 2005 21 1753 1757
62. G. Carbone L. Mangialardi Eur. Phys. J. E 2005 16 67 76