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Volumn 43, Issue 6, 2002, Pages 1907-1913

X-ray diffraction study of the structure of thin polyfluorene films

Author keywords

Grazing incidence X ray diffraction; Polyfluorene; Thin films

Indexed keywords

LIQUID CRYSTAL POLYMERS; SILICON; X RAY DIFFRACTION;

EID: 0037074271     PISSN: 00323861     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0032-3861(01)00753-4     Document Type: Article
Times cited : (119)

References (20)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.