MONOX: A characterization tool for the X-UV range

EPJ Applied Physics

Volumn 31, Issue 2, 2005, Pages 147-152

  Andre J M ^a   Avila, A ^a   Barchewitz, R ^a   Benbalagh, R ^a   Delaunay, R ^a   Druart, D ^a   Jonnard, P ^a   Ringuenet, H ^a  

^a SORBONNE UNIVERSITÉ   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; CRYSTALLINE MATERIALS; DIFFRACTION GRATINGS; GONIOMETERS; MIRRORS; RADIATION EFFECTS; X RAY SPECTROMETERS;

CRYSTAL MONOCHROMATORS; DISPERSIVE MODES; REFLECTIVITY MEASUREMENTS; WAVELENGTH SELECTION;

ULTRAVIOLET DEVICES;

EID: 24344450312     PISSN: 12860042     EISSN: None     Source Type: Journal    
DOI: 10.1051/epjap:2005047     Document Type: Article

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