Two-color reflection multilayers for He-I and He-II resonance lines for microscopic ultraviolet photoelectron spectroscopy using Schwarzschild objective

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 40, Issue 1, 2001, Pages 376-379

  Ejima, T ^a   Kondo, Y ^a   Watanabe, M ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

He resonance line; Mirror; Multilayer; Reflection coating; Ultraviolet

Indexed keywords

LIGHT REFLECTION; MIRRORS; REFLECTIVE COATINGS; SEMICONDUCTING SILICON COMPOUNDS; ULTRAVIOLET SPECTROSCOPY;

RESONANCE LINES;

MULTILAYERS;

EID: 0035056414     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/JJAP.40.376     Document Type: Article

References (10)