Doping in poly(o-ethoxyaniline) nanostructured films studied with atomic force spectroscopy (AFS)

Micron

Volumn 39, Issue 8, 2008, Pages 1119-1125

  Leite, F L ^a,b   Alves, W F ^a   Neto, M Oliveira ^b   Polikarpov, I ^b   Herrmann, P S P ^a   Mattoso, L H C ^a   Oliveira Jr, O N ^b  

^a EMBRAPA CERRADOS   (Brazil)

^b UNIVERSITY OF SÃO PAULO   (Brazil)

Author keywords

Adhesion forces; Atomic force microscopy; Conducting polymers; Doping; Force curve; Force spectroscopy; Layer by layer; Poly(o ethoxyaniline); SAXS; Self assembly

Indexed keywords

ACIDS; ADHESION; ATOMIC PHYSICS; ATOMS; INORGANIC ACIDS; INORGANIC COMPOUNDS; NANOSTRUCTURED MATERIALS; PHASE INTERFACES; SURFACE PHENOMENA;

ADHESION FORCES; ATOMIC FORCE MICROSCOPE; ATOMIC FORCE MICROSCOPY; ATOMIC FORCE SPECTROSCOPY; BIO-SENSING; CONDUCTING POLYMERS; DOPING; FORCE CURVE; FORCE SPECTROSCOPY; INTER-MOLECULAR INTERACTIONS; INTERFACIAL PHENOMENA; LAYER-BY-LAYER; LIQUID SAMPLES; NANOSTRUCTURED FILMS; POLY(O-ETHOXYANILINE); SAMPLE SURFACES; SAXS; SELF-ASSEMBLY;

ATOMIC SPECTROSCOPY;

EID: 52049098685     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.micron.2008.07.003     Document Type: Article

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