SCOPUS 정보 검색 플랫폼

Journal of Molecular Catalysis A: Chemical

Volumn 167, Issue 1-2, 2001, Pages 235-243

Dielectric constant measurements of interfacial aqueous solutions using atomic force microscopy

(3) De Souza, E F a Ceotto, G b Teschke, O c

a PONTIFÍCIA UNIVERSIDADE CATÓLICA DE CAMPINAS (Brazil)

b FEDERAL UNIVERSITY OF VIÇOSA (Brazil)

c UNIVERSITY OF CAMPINAS (Brazil)

Author keywords

Atomic force microscopy; Dielectric exchange force; Hydration force; Surface attractive and repulsive forces; Waters double layer variable dielectric constant

Indexed keywords

AQUEOUS SOLUTION; ATOMIC FORCE MICROSCOPY; CONFERENCE PAPER; DIELECTRIC CONSTANT; HYDRATION; HYDROGEN BOND; IMMERSION; MEASUREMENT; MOLECULAR INTERACTION; SURFACE TENSION;

EID: 0035916197 PISSN: 13811169 EISSN: None Source Type: Journal
DOI: 10.1016/S1381-1169(00)00511-2 Document Type: Conference Paper

Times cited : (17)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.