TEM, XRD and AFM study of poly(o-ethoxyaniline) films: New evidence for the formation of conducting islands

Applied Physics A: Materials Science and Processing

Volumn 93, Issue 2, 2008, Pages 537-542

  Leite, Fabio L ^a   Alves, William F ^a   Mir, Mirta ^c   Mascarenhas, Yvonne P ^b   Herrmann, Paulo S P ^a   Mattoso, Luiz H C ^a   Oliveira Jr , Osvaldo N ^b  

^a EMBRAPA CERRADOS   (Brazil)

^b UNIVERSITY OF SÃO PAULO   (Brazil)

^c FEDERAL UNIVERSITY OF ALFENAS   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; POLYANILINE; X RAY DIFFRACTION;

ATOMIC FORCE SPECTROSCOPY; CONDUCTING MECHANISM; CONDUCTIVITY MEASUREMENTS; DOUBLE LAYER FORCE; FINITE SIZE EFFECT; POLY(O-ETHOXYANILINE); QUASI-ONE DIMENSIONAL; VARIABLE-RANGE HOPPING;

CONDUCTIVE FILMS;

EID: 51649110356     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s00339-008-4686-9     Document Type: Article

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