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The impact of random device variation on SRAM cell stability in sub-90-nm CMOS technologies
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January
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K. Agarwal and S. Nassif, "The impact of random device variation on SRAM cell stability in sub-90-nm CMOS technologies," IEEE Transactions on Very Large Scale Integration Systems, vol. 16, no. 1, pp. 86-96, January 2008.
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