Reliability assessment of AlGaN/GaN HEMT technology on SIC for 48V applications

IEEE International Reliability Physics Symposium Proceedings

Volumn , Issue , 2008, Pages 446-449

  Lee, Sangmin ^a   Vetury, Ramakrishna ^a   Brown, Jeffrey D ^a   Gibb, Shawn R ^a   Cai, Will Z ^a   Sun, Jinming ^a   Green, Daniel S ^a   Shealy, Jeff ^a  

^a RF MICRO DEVICES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER NETWORKS; SEMICONDUCTING GALLIUM; SILICON CARBIDE;

FAILURE CRITERION; RELIABILITY ASSESSMENTS; RELIABILITY PHYSICS;

RELIABILITY;

EID: 51549121829     PISSN: 15417026     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RELPHY.2008.4558926     Document Type: Conference Paper

References (11)

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