Precise failure localization using automated layout analysis of diagnosis candidates

Proceedings - Design Automation Conference

Volumn , Issue , 2008, Pages 367-372

  Tam, Wing Chiu ^a   Poku, Osei ^a   Blanton, R D ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

Defect localization; Diagnosis; Layout analysis; Physical failure analysis

Indexed keywords

DEFECT LOCALIZATION; DESIGN AUTOMATION CONFERENCE; DIAGNOSIS; LAYOUT ANALYSIS; PHYSICAL FAILURE ANALYSIS;

AUTOMATION; COMPUTER AIDED DESIGN; DIGITAL INTEGRATED CIRCUITS; EVOLUTIONARY ALGORITHMS; INDUSTRIAL ENGINEERING; SAFETY FACTOR;

FAILURE ANALYSIS;

EID: 51549114096     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DAC.2008.4555845     Document Type: Conference Paper

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