Towards high accuracy fault diagnosis of digital circuits

Proceedings of the 30th International Symposium for Testing and Failure Analysis, ISTFA 2004

Volumn , Issue , 2004, Pages 47-51

  Hora, Camelia ^a   Eichenberger, Stefan ^b  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

^b NXP SEMICONDUCTORS   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTER AIDED DIAGNOSIS; COMPUTER SIMULATION; CONFORMAL MAPPING; ELECTRIC FAULT CURRENTS; ELECTRIC VARIABLES MEASUREMENT; FLIP FLOP CIRCUITS; INTEGRATED CIRCUITS; MATHEMATICAL MODELS; RELIABILITY; SOFTWARE ENGINEERING;

DIAGNOSIS ALGORITHMS; FAULT DIAGNOSIS; FAULT LOCATION; FAULT MODELS;

DIGITAL CIRCUITS;

EID: 10444275781     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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