Diagnostic fault simulation for the failure analyst

Proceedings of the 30th International Symposium for Testing and Failure Analysis, ISTFA 2004

Volumn , Issue , 2004, Pages 181-190

  Bodoh, Dan ^a   Blakely, Anthony ^a   Garyet, Terry ^a  

^a FREESCALE SEMICONDUCTOR INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TEST PATTERN GENERATION (ATPG); DESIGN-FOR-TEST (DFT); DIAGNOSTIC FAULT SIMULATION;

ALGORITHMS; COMPUTER SIMULATION; DATA ACQUISITION; DATABASE SYSTEMS; FAILURE ANALYSIS; MATHEMATICAL MODELS;

ELECTRIC FAULT CURRENTS;

EID: 10444247469     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)

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