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Volumn , Issue , 2008, Pages 59-66

Cu pillar bumps as a lead-free drop-in replacement for solder-bumped, flip-chip interconnects

Author keywords

[No Author keywords available]

Indexed keywords

BRAZING; COMPUTER NETWORKS; COPPER;

EID: 51349126506     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ECTC.2008.4549951     Document Type: Conference Paper
Times cited : (63)

References (11)
  • 7
    • 79958223410 scopus 로고    scopus 로고
    • Current crowding induced electromigration failure in flip chip solder joints
    • E. C. C. Yeh, W. J. Choi, and K. N. Tu, "Current crowding induced electromigration failure in flip chip solder joints", Appl. Phys. Lett., 80 (2002), pp. 580-582.
    • (2002) Appl. Phys. Lett , vol.80 , pp. 580-582
    • Yeh, E.C.C.1    Choi, W.J.2    Tu, K.N.3
  • 11
    • 51349094134 scopus 로고    scopus 로고
    • JEDEC JEP154, Guideline for Characterizing Solder Bump Electromigration under Constant Current and Temperature Stress, Jan. 2008, www.jedec.org
    • JEDEC JEP154, "Guideline for Characterizing Solder Bump Electromigration under Constant Current and Temperature Stress", Jan. 2008, www.jedec.org


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.