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Volumn , Issue , 2008, Pages 113-122

Effect of joint size and pad metallization on solder mechanical properties

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC COMPONENTS; PAD METALLIZATION;

EID: 51349087365     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ECTC.2008.4549957     Document Type: Conference Paper
Times cited : (21)

References (17)
  • 1
    • 0001784769 scopus 로고
    • Reliability of Plastic Ball Grid Array Assembly
    • J. Lau Editor, McGraw-Hill, Inc, New York
    • R. Darveaux, K. Banerji, A. Mawer, and G. Dody, "Reliability of Plastic Ball Grid Array Assembly," Ball Grid Array Technology. J. Lau Editor, McGraw-Hill, Inc., New York, 1995.
    • (1995) Ball Grid Array Technology
    • Darveaux, R.1    Banerji, K.2    Mawer, A.3    Dody, G.4
  • 2
    • 51349110404 scopus 로고
    • Mechanical Evaluation of Indium for Die Attachment in a Multichip Package,
    • PhD Thesis, North Carolina State University
    • R. Darveaux, "Mechanical Evaluation of Indium for Die Attachment in a Multichip Package," PhD Thesis, North Carolina State University, 1992.
    • (1992)
    • Darveaux, R.1
  • 3
    • 24644469657 scopus 로고    scopus 로고
    • R. Darveaux, Shear Deformation of Lead Free Solder Joints, Proc. 2005 ECTC, pp. 882-893.
    • R. Darveaux, "Shear Deformation of Lead Free Solder Joints," Proc. 2005 ECTC, pp. 882-893.
  • 4
    • 51349157000 scopus 로고    scopus 로고
    • R. Darveaux, Mechanical Testing of Solder Joint Arrays versus Bulk Solder Specimens, Journal of Surface Mount Technology, 20, issue 1, pp 11-21, and Proc. SMTAI, 2006.
    • R. Darveaux, "Mechanical Testing of Solder Joint Arrays versus Bulk Solder Specimens," Journal of Surface Mount Technology, vol 20, issue 1, pp 11-21, and Proc. SMTAI, 2006.
  • 5
    • 33845567943 scopus 로고    scopus 로고
    • Interface Failure in Lead Free Solder Joints
    • May
    • R. Darveaux, C. Reichman, N. Islam, "Interface Failure in Lead Free Solder Joints," Proc. ECTC, May 2006.
    • (2006) Proc. ECTC
    • Darveaux, R.1    Reichman, C.2    Islam, N.3
  • 6
    • 51349134886 scopus 로고    scopus 로고
    • National Electronics Center of Excellence
    • National Electronics Center of Excellence, EMPF July 2001, Internet publication (www.empf.org/emphasis)
    • (2001) Internet publication
    • July, E.M.P.F.1
  • 9
    • 3342877548 scopus 로고    scopus 로고
    • R.S. Sidhu, N. Chawla, Materials Characterization 52 (2004) Short Communication, p225-230
    • R.S. Sidhu, N. Chawla, Materials Characterization 52 (2004) Short Communication, p225-230
  • 12
    • 25844438737 scopus 로고    scopus 로고
    • July/September
    • S.K. Kang et al, IBM J. Res. & Dev. Vol 49, No.4/5, July/September 2005, p607-618
    • (2005) IBM J. Res. & Dev , vol.49 , Issue.4-5 , pp. 607-618
    • Kang, S.K.1
  • 13
    • 50349101252 scopus 로고    scopus 로고
    • Ductile-to-Brittle Transition Strain Rate
    • R. Darveaux and C. Reichman, "Ductile-to-Brittle Transition Strain Rate," Proc EPTC, 2006.
    • (2006) Proc EPTC
    • Darveaux, R.1    Reichman, C.2
  • 14
    • 33847131557 scopus 로고    scopus 로고
    • Updated Life Prediction Models for Solder Joints with Removal of Modeling Assumptions and Effect of Constitutive Equations
    • Syed, A., "Updated Life Prediction Models for Solder Joints with Removal of Modeling Assumptions and Effect of Constitutive Equations," Proceedings of EuroSime 2006 Conference, 2006, pp. 639-647
    • (2006) Proceedings of EuroSime 2006 Conference , pp. 639-647
    • Syed, A.1
  • 17
    • 51349148745 scopus 로고    scopus 로고
    • R. Darveaux, Effect of Assembly Stiffness and Solder Properties on Thermal Cycle Acceleration Factors, Proc. 11th International Workshop on Thermal Investigations of ICs and Systems (THERMINC), Belgirate, Lake Maggiore, Italy, 9/27 - 9/30 2005.
    • R. Darveaux, "Effect of Assembly Stiffness and Solder Properties on Thermal Cycle Acceleration Factors," Proc. 11th International Workshop on Thermal Investigations of ICs and Systems (THERMINC), Belgirate, Lake Maggiore, Italy, 9/27 - 9/30 2005.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.