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Volumn 47, Issue 13, 2008, Pages

Fluoride antireflection coatings deposited at 193 nm

Author keywords

[No Author keywords available]

Indexed keywords

ANTIREFLECTION COATINGS; FLUORINE COMPOUNDS; LASER DAMAGE; SURFACE ROUGHNESS;

EID: 50849127877     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.47.00C214     Document Type: Article
Times cited : (14)

References (20)
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  • 7
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    • Film structure and optical constants of magnetronsputtered fluoride films for deep ultraviolet lithography
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    • Taki, Y.1
  • 8
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    • Optical and microstructural properties of MgF2 UV coatings grown by ion beam sputtering process
    • E. Quesnel, L. Dumas, D. Jacob, and F. Peiro, "Optical and microstructural properties of MgF2 UV coatings grown by ion beam sputtering process," J. Vac. Sci. Technol. A 18, 2869-2876 (2000).
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  • 10
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    • Characterization of AlF, thin films at 193 nm by thermal evaporation
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    • Lee, C.C.1    Liu, M.C.2    Kaneko, M.3    Nakahira, K.4    Takano, Y.5
  • 12
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    • Microstructure related properties of lanthanum fluoride films deposited by molybdenum boat evaporation at 193 nm
    • M. C. Liu, C. C. Lee, M. Kaneko, K. Nakahira, and Y. Takano, "Microstructure related properties of lanthanum fluoride films deposited by molybdenum boat evaporation at 193 nm," Thin Solid Films 492/1-2, 45-51 (2005).
    • (2005) Thin Solid Films , vol.492 , Issue.1-2 , pp. 45-51
    • Liu, M.C.1    Lee, C.C.2    Kaneko, M.3    Nakahira, K.4    Takano, Y.5
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.