Growth structure investigation of MgF2 and NdF3 films grown by molecular beam deposition on CaF2 (111) substrates

Thin Solid Films

Volumn 280, Issue 1-2, 1996, Pages 5-15

  Kaiser, U ^a   Adamik, M ^b   Safran G ^b   Barna, P B ^b   Laux, S ^a   Richter, W ^a  

^a FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

^b RESEARCH INSTITUTE FOR TECHNICAL PHYSICS AND MATERIALS SCIENCE   (Hungary)

Author keywords

Deposition process; Nanocrystalline; Transmission electron microscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; CALCIUM COMPOUNDS; DEPOSITION; FLUORINE COMPOUNDS; FRACTOGRAPHY; LIGHT ABSORPTION; MOLECULAR BEAMS; NANOSTRUCTURED MATERIALS; SUBSTRATES; SURFACE PROPERTIES; TRANSMISSION ELECTRON MICROSCOPY; VACUUM;

CALCIUM FLUORIDE; MAGNESIUM FLUORIDE; MICROFRACTOGRAPHICAL REPLICATIONS; MOLECULAR BEAM DEPOSITION; NEODYMIUM FLUORIDE; PACKING DENSITY; SURFACE REPLICATIONS; ULTRAHIGH VACUUM;

FILM GROWTH;

EID: 0030195619     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/0040-6090(95)08237-9     Document Type: Article

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