Depth-resolved strain measurements in polycrystalline multilayers by energy-variable X-ray diffraction

Thin Solid Films

Volumn 516, Issue 22, 2008, Pages 8036-8041

  Zolotoyabko, Emil ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

Depth resolution; Multilayers; Non destructive testing; Strain analysis; Synchrotron radiation; X ray diffraction

Indexed keywords

DIFFRACTION; STRAIN; STRAIN MEASUREMENT; X RAY ANALYSIS; X RAY DIFFRACTION;

ANALYTICAL EXPRESSIONS; DEPTH RESOLUTION; DEPTH SENSITIVITY; DEPTH-RESOLVED; DIFFRACTION INTENSITIES; ENERGY-DEPENDENT; MULTI LAYERING; NON-DESTRUCTIVE TESTING; NOVEL METHODS; POLY-CRYSTALLINE; POLYCRYSTALLINE MULTILAYERS; RESIDUAL STRAINS; STRAIN ANALYSIS; STRAIN MEASUREMENTS; SYNCHROTRON RADIATION; X-RAY DIFFRACTION TECHNIQUE; X-RAY ENERGIES; X-RAY PENETRATIONS;

MULTILAYERS;

EID: 50649123536     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2008.04.010     Document Type: Article

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