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Volumn 200, Issue , 2003, Pages 382-389
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Non-destructive microstructural analysis with depth resolution
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Author keywords
Microstructure; Seashells; X ray diffraction
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Indexed keywords
CRYSTAL MICROSTRUCTURE;
CRYSTAL ORIENTATION;
GRAIN SIZE AND SHAPE;
NONDESTRUCTIVE EXAMINATION;
STRAIN;
X RAY DIFFRACTION;
DEPTH RESOLUTION;
POLYCRYSTALLINE MATERIALS;
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EID: 0037250793
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-583X(02)01727-5 Document Type: Conference Paper |
Times cited : (15)
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References (18)
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