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Volumn 200, Issue , 2003, Pages 382-389

Non-destructive microstructural analysis with depth resolution

Author keywords

Microstructure; Seashells; X ray diffraction

Indexed keywords

CRYSTAL MICROSTRUCTURE; CRYSTAL ORIENTATION; GRAIN SIZE AND SHAPE; NONDESTRUCTIVE EXAMINATION; STRAIN; X RAY DIFFRACTION;

EID: 0037250793     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(02)01727-5     Document Type: Conference Paper
Times cited : (15)

References (18)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.