The Characterisation of Residual Strain in Ensis siliqua Shells

Journal of Bionic Engineering

Volumn 3, Issue 1, 2006, Pages 33-38

  Scurr, D J ^a   Cernik, R J ^a,b   Thompson, S P ^b   Mummery, P M ^a   Eichhorn, S J ^a  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

^b DARESBURY LABORATORY   (United Kingdom)

Author keywords

Ensis siliqua shell; residual strain; synchrostron X ray diffraction

Indexed keywords

EID: 33745492403     PISSN: 16726529     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1672-6529(06)60004-8     Document Type: Article

References (12)

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