Depth-resolved strain measurements in polycrystalline materials by energy-variable X-ray diffraction

Journal of Synchrotron Radiation

Volumn 11, Issue 4, 2004, Pages 309-313

  Zolotoyabko, E ^a   Pokroy, B ^a   Quintana, J P ^b  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

^b NORTHWESTERN UNIVERSITY   (United States)

Author keywords

Microstructure; Residual strains; X ray diffraction

Indexed keywords

CRYSTAL LATTICES; FUNCTIONS; MICROSTRUCTURE; MONOCHROMATORS; RESIDUAL STRESSES; STRAIN MEASUREMENT; X RAY DIFFRACTION;

ENERGY VARIABLE DIFFRACTION (EVD); GRAIN SIZE; MICROSTRAIN FLUCTUATIONS;

POLYCRYSTALLINE MATERIALS;

EID: 11844272662     PISSN: 09090495     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0909049504007460     Document Type: Article

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