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Volumn , Issue , 2008, Pages 80-85

Analysis of the influence of intermittent faults in a microcontroller

Author keywords

Intermittent faults; VHDL based fault injection

Indexed keywords

COMPUTER HARDWARE DESCRIPTION LANGUAGES; COMPUTER NETWORKS; COMPUTER SYSTEMS; ELECTRON TUBES; MICROCONTROLLERS; VLSI CIRCUITS;

EID: 50649108927     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DDECS.2008.4538761     Document Type: Conference Paper
Times cited : (32)

References (22)
  • 1
    • 0141837018 scopus 로고    scopus 로고
    • Trends and Challenges in VLSI Circuit Reliability
    • C. Constantinescu, "Trends and Challenges in VLSI Circuit Reliability", IEEE Micro, Vol. 23(4):14-19, 2003.
    • (2003) IEEE Micro , vol.23 , Issue.4 , pp. 14-19
    • Constantinescu, C.1
  • 4
    • 4444251694 scopus 로고    scopus 로고
    • Simulating SET in VDSM ICs for Ground Level Radiation
    • D. Alexandrescu, L. Anghel, and M. Nicholaidis, "Simulating SET in VDSM ICs for Ground Level Radiation", in JETTA(20):413-421, 2004.
    • (2004) JETTA , vol.20 , pp. 413-421
    • Alexandrescu, D.1    Anghel, L.2    Nicholaidis, M.3
  • 6
    • 0036922146 scopus 로고    scopus 로고
    • Impact of Deep Submicron Technology on Dependability of VLSI Circuits
    • Washington D.C, June
    • C. Constantinescu, "Impact of Deep Submicron Technology on Dependability of VLSI Circuits", in Proc. DSN 2002, pp. 205-209, Washington D.C., June 2002.
    • (2002) in Proc , vol.DSN 2002 , pp. 205-209
    • Constantinescu, C.1
  • 10
    • 50649091248 scopus 로고    scopus 로고
    • C. Constantinescu, Impact of Intermittent Faults on Nanocomputing Devices, in WDSN-07, Edinburgh, UK, June 2007. http://www.laas.fr/WDSN07.
    • C. Constantinescu, "Impact of Intermittent Faults on Nanocomputing Devices", in WDSN-07, Edinburgh, UK, June 2007. http://www.laas.fr/WDSN07.
  • 12
    • 0037244941 scopus 로고    scopus 로고
    • Study, Comparison and Application of different VHDL-Based Fault Injection Techniques for the Experimental Validation of a Fault-Tolerant System
    • D. Gil, J. Gracia, J.C. Baraza, and P.J. Gil, "Study, Comparison and Application of different VHDL-Based Fault Injection Techniques for the Experimental Validation of a Fault-Tolerant System", Microelectronics Journal, vol. 34(1):41-51, 2003.
    • (2003) Microelectronics Journal , vol.34 , Issue.1 , pp. 41-51
    • Gil, D.1    Gracia, J.2    Baraza, J.C.3    Gil, P.J.4
  • 13
    • 0003568839 scopus 로고    scopus 로고
    • IEEE Standard VHDL Language Reference Manual
    • IEEE Std 1076-1993
    • "IEEE Standard VHDL Language Reference Manual", IEEE Std 1076-1993.
  • 20
    • 0038529280 scopus 로고    scopus 로고
    • Physical and predictive models of ultrathin oxide reliability in CMOS devices and circuits
    • March
    • J.H. Stathis, "Physical and predictive models of ultrathin oxide reliability in CMOS devices and circuits", IEEE Transactions On Device And Materials Reliability, Vol. 1(1):43-59, March 2001.
    • (2001) IEEE Transactions On Device And Materials Reliability , vol.1 , Issue.1 , pp. 43-59
    • Stathis, J.H.1
  • 21
    • 0036534998 scopus 로고    scopus 로고
    • A Prototype of a VHDL-Based Fault Injection Tool: Description and Application
    • J.C. Baraza, J. Gracia, D. Gil, and P.J. Gil, "A Prototype of a VHDL-Based Fault Injection Tool: Description and Application", Journal of Systems Architecture, vol. 47(10):847-867, 2002.
    • (2002) Journal of Systems Architecture , vol.47 , Issue.10 , pp. 847-867
    • Baraza, J.C.1    Gracia, J.2    Gil, D.3    Gil, P.J.4
  • 22
    • 50649102942 scopus 로고    scopus 로고
    • http:/www.oregano.at


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.