Dependability benchmarking using environmental test tools

Proceedings - Annual Reliability and Maintainability Symposium

Volumn , Issue , 2005, Pages 567-571

  Constantinescu, Cristian ^a  

^a INTEL CORPORATION   (United States)

Author keywords

Dependability benchmarking; Environmental test; Silent data corruption

Indexed keywords

COMPUTATIONAL ERRORS; FAULT INJECTION; OPERATING VOLTAGES; DEPENDABILITY BENCHMARKING; ENVIRONMENTAL TEST; SILENT DATA CORRUPTION;

COMPUTATION THEORY; ELECTRIC POTENTIAL; ERROR ANALYSIS; SEMICONDUCTOR DEVICES; COMPUTER HARDWARE; COMPUTER SYSTEMS; DISKS (MACHINE COMPONENTS); ELECTRIC FIELDS; SERVERS; VOLTAGE CONTROL;

BENCHMARKING;

EID: 27744488046     PISSN: 0149144X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RAMS.2005.1408423     Document Type: Conference Paper

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