메뉴 건너뛰기




Volumn , Issue , 2006, Pages 825-830

Development of coaxial shield via in silicon carrier for high frequency application

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMOBILE ELECTRONIC EQUIPMENT; AUTOMOBILE PARTS AND EQUIPMENT; CELLULAR RADIO SYSTEMS; CHIP SCALE PACKAGES; CIVIL AVIATION; CROSSTALK; ELECTRONICS PACKAGING; INTERNET PROTOCOLS; LITHOGRAPHY; NONMETALS; OPTICAL DESIGN; PHOTORESISTS; SIGNAL PROCESSING; SILICON; SILICON WAFERS; SUBSTRATES; SYSTEMS ANALYSIS; TECHNOLOGY; VEHICLE TRANSMISSIONS;

EID: 50249151500     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EPTC.2006.342819     Document Type: Conference Paper
Times cited : (26)

References (10)
  • 1
    • 25844453501 scopus 로고    scopus 로고
    • Development of next generation system-on-package (SOP) technology based on silicon carriers with fine-pitch chip interconnection
    • J.U. Knickerbocker et al., "Development of next generation system-on-package (SOP) technology based on silicon carriers with fine-pitch chip interconnection," IBM J. Res. & Dev. vol 49, pp 725-750, 2005.
    • (2005) IBM J. Res. & Dev , vol.49 , pp. 725-750
    • Knickerbocker, J.U.1
  • 2
    • 0033727203 scopus 로고    scopus 로고
    • Suppression of substrate crosstalk in mixed-signal complementary MOS circuits using high-resistivity SIMOX (Seperated by IMplanted OXygert) wafers
    • J. Kodate, M. Harada, and T. Tsukahara, "Suppression of substrate crosstalk in mixed-signal complementary MOS circuits using high-resistivity SIMOX (Seperated by IMplanted OXygert) wafers," Japan J. Appl. Phys., vol. 39, pp 2256-2260, 2000.
    • (2000) Japan J. Appl. Phys , vol.39 , pp. 2256-2260
    • Kodate, J.1    Harada, M.2    Tsukahara, T.3
  • 7
    • 0141918454 scopus 로고    scopus 로고
    • The importance of distributed grounding in combination with porous Si trenched for reduction of RF-crosstalk through p-Si substrate
    • H. S. Kim, K. Chong, Y. H. Xie, K. A. Jenkins, "The importance of distributed grounding in combination with porous Si trenched for reduction of RF-crosstalk through p-Si substrate," IEEE Electron Device Lett., vol. 24, pp 640-642, 2003.
    • (2003) IEEE Electron Device Lett , vol.24 , pp. 640-642
    • Kim, H.S.1    Chong, K.2    Xie, Y.H.3    Jenkins, K.A.4
  • 8
    • 0031695978 scopus 로고    scopus 로고
    • Copper interconnections and reliability
    • C. K. Hu and J. M. E. Harper, "Copper interconnections and reliability," Mater. Chem. Phys., vol 52, pp 5-16, 1998.
    • (1998) Mater. Chem. Phys , vol.52 , pp. 5-16
    • Hu, C.K.1    Harper, J.M.E.2
  • 10
    • 33746556795 scopus 로고    scopus 로고
    • High frequency design and characterization of SU-8 based conductor backed coplanar waveguide transmission lines
    • F. D. Mbairi, H. Hesselbom, "High frequency design and characterization of SU-8 based conductor backed coplanar waveguide transmission lines", Proc. IEEE Adv. Packaging Materials, pp 243-248, 2005.
    • (2005) Proc. IEEE Adv. Packaging Materials , pp. 243-248
    • Mbairi, F.D.1    Hesselbom, H.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.