Fundamental photophysics and optical loss processes in Si-nanocrystal-doped microdisk resonators

Physical Review A - Atomic, Molecular, and Optical Physics

Volumn 78, Issue 2, 2008, Pages

  Kekatpure, Rohan D ^a   Brongersma, Mark L ^a  

^a STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION; DISKS (STRUCTURAL COMPONENTS); NANOCRYSTALLINE ALLOYS; NANOCRYSTALS; NANOSTRUCTURED MATERIALS; NANOSTRUCTURES; NANOTECHNOLOGY; NONMETALS; NUMERICAL ANALYSIS; OPTICAL DESIGN; QUANTUM ELECTRONICS; RESONATORS; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR QUANTUM DOTS; SILICON; VIDEODISKS;

ANALYTICAL MODELLING; ATTENUATION COEFFICIENTS; DESIGN IMPROVEMENTS; DESIGN RULES; ENHANCEMENT FACTORS; EXPERIMENTAL STUDIES; FREE-CARRIER ABSORPTION; LINE-EDGE ROUGHNESS; LOW TEMPERATURES; MICROCAVITY MODES; MICRODISK RESONATORS; MIE-SCATTERING; NANOCRYSTAL SIZE DISTRIBUTION; NUMERICAL CALCULATIONS; OPTICAL-; PHOTOPHYSICS; QUALITY FACTOR; RAY-OPTICS; SI-NANOCRYSTAL; SI-NANOCRYSTALS; SILICON QUANTUM DOTS; THEORETICAL CALCULATIONS; VECTORIAL FINITE ELEMENT METHOD;

FINITE ELEMENT METHOD;

EID: 50049121918     PISSN: 10502947     EISSN: 10941622     Source Type: Journal    
DOI: 10.1103/PhysRevA.78.023829     Document Type: Article

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