Cavity Q measurements of silica microspheres with nanocluster silicon active layer

IEEE Journal on Selected Topics in Quantum Electronics

Volumn 12, Issue 6, 2006, Pages 1388-1392

  Sung, Joo Yeon ^a,b   Tewary, Anuranjita ^c   Brongersma, Mark L ^c   Shin, Jung H ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^b LG Electronics Inc   (South Korea)

^c STANFORD UNIVERSITY   (United States)

Author keywords

Loss mechanism; Microsphere; Nanocluster Si

Indexed keywords

ANNEALING; LIGHT SCATTERING; OPTICAL FIBERS; Q FACTOR MEASUREMENT; SEMICONDUCTOR LASERS; SILICA; SILICON; THICK FILMS;

LASER MELTING; MICROSPHERES; OPTICAL LOSSES; Q-FACTORS;

NANOSTRUCTURED MATERIALS;

EID: 33845631449     PISSN: 1077260X     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSTQE.2006.885631     Document Type: Article

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