Beyond the Rayleigh scattering limit in high-Q silicon microdisks: Theory and experiment

Optics Express

Volumn 13, Issue 5, 2005, Pages 1515-1530

  Borselli, Matthew ^a   Johnson, Thomas J ^a   Painter, Oskar ^a  

^a California Institute of Technology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE MATERIALS; LIGHT PROPAGATION; OPTICAL RESONATORS; SILICON; SILICON ON INSULATOR TECHNOLOGY; SURFACE ROUGHNESS;

MICRODISKS; MODE COUPLING; OPTICAL LOSSES; RESIST REFLOW;

RAYLEIGH SCATTERING;

EID: 17544367675     PISSN: 10944087     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OPEX.13.001515     Document Type: Article

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