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Volumn , Issue , 2008, Pages 354-359

A delay-efficient radiation-hard digital design approach using CWSP elements

Author keywords

[No Author keywords available]

Indexed keywords

CODE WORDS; DIGITAL DESIGNS; RADIATION-HARDENED;

EID: 49749097139     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.2008.4484705     Document Type: Conference Paper
Times cited : (36)

References (33)
  • 8
    • 0019661484 scopus 로고
    • CMOS RAM cosmic-ray-induced error rate analysis
    • J. Pickle and J. Blandford, "CMOS RAM cosmic-ray-induced error rate analysis," IEEE Trans. on Nuclear Science, vol. NS-29, pp. 3962-3967, 1981.
    • (1981) IEEE Trans. on Nuclear Science , vol.NS-29 , pp. 3962-3967
    • Pickle, J.1    Blandford, J.2
  • 11
    • 0020298427 scopus 로고
    • Collection of charge on junction nodes from ion tracks
    • G. Messenger, "Collection of charge on junction nodes from ion tracks," IEEE Trans. Nuclear Science, vol. 29, no. 6, pp. 2024-2031, 1982.
    • (1982) IEEE Trans. Nuclear Science , vol.29 , Issue.6 , pp. 2024-2031
    • Messenger, G.1
  • 16
    • 15044363155 scopus 로고    scopus 로고
    • Robust system design with built-in soft-error resilience
    • Feb
    • S. Mitra, N. Seifert, M. Zhang, and K. Kim, "Robust system design with built-in soft-error resilience," IEEE Computer, pp. 43-52, Feb 2005.
    • (2005) IEEE Computer , pp. 43-52
    • Mitra, S.1    Seifert, N.2    Zhang, M.3    Kim, K.4
  • 19
    • 0018331014 scopus 로고
    • Alpha-particle-induced soft errors in dynamic memories
    • jan
    • T. May and M. Woods, "Alpha-particle-induced soft errors in dynamic memories," IEEE Trans. on Electron Devices, vol. ED-26, pp. 2-9, jan 1979.
    • (1979) IEEE Trans. on Electron Devices , vol.ED-26 , pp. 2-9
    • May, T.1    Woods, M.2
  • 20
    • 0028714164 scopus 로고
    • A proposed SEU tolerant dynamic random access memory (DRAM) cell
    • Dec
    • G. Agrawal, L. Massengill, and K. Gulati, "A proposed SEU tolerant dynamic random access memory (DRAM) cell," in IEEE Transactions on Nuclear Science, vol. 41, pp. 2035-2042, Dec 1994.
    • (1994) IEEE Transactions on Nuclear Science , vol.41 , pp. 2035-2042
    • Agrawal, G.1    Massengill, L.2    Gulati, K.3
  • 21
    • 0032684765 scopus 로고    scopus 로고
    • Time redundancy based soft-error tolerance to rescue nanometer technologies
    • April
    • M. Nicolaidis, "Time redundancy based soft-error tolerance to rescue nanometer technologies," in VLSI Test Symposium, pp. 86-94, April 1999.
    • (1999) VLSI Test Symposium , pp. 86-94
    • Nicolaidis, M.1
  • 23
    • 0032684765 scopus 로고    scopus 로고
    • Time redundancy-based soft-error tolerance to rescue nanometer technologies
    • M. Nicolaidis, "Time redundancy-based soft-error tolerance to rescue nanometer technologies," in Proceedings, IEEE VLSI Test Symposium, pp. 86-94, 1999.
    • (1999) Proceedings, IEEE VLSI Test Symposium , pp. 86-94
    • Nicolaidis, M.1
  • 25
  • 26
    • 49749104092 scopus 로고    scopus 로고
    • E. E. C. for Space Standardization, Energetic Particle Radiation, http://www.spenvis.oma.be/spenvis/ecss/ecss09/ecss09.html.
    • E. E. C. for Space Standardization, "Energetic Particle Radiation, http://www.spenvis.oma.be/spenvis/ecss/ecss09/ecss09.html."
  • 32


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.