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Volumn 25, Issue 8, 2008, Pages 2942-2945
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CHF3 dual-frequency capacitively coupled plasma by optical emission spectroscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
BOND STRENGTH (CHEMICAL);
DISSOCIATION;
OPTICAL EMISSION SPECTROSCOPY;
SILICON COMPOUNDS;
DISSOCIATION REACTIONS;
DUAL FREQUENCY;
DUAL-FREQUENCY CAPACITIVELY COUPLED PLASMAS;
GAS-PHASES;
LOW DIELECTRIC CONSTANTS;
LOW-K FILMS;
OPTICAL-EMISSION SPECTROSCOPY;
POWER;
RADICAL CONCENTRATION;
SPATIAL UNIFORMITY;
ETCHING;
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EID: 49749086114
PISSN: 0256307X
EISSN: 17413540
Source Type: Journal
DOI: 10.1088/0256-307X/25/8/057 Document Type: Article |
Times cited : (11)
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References (18)
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