Completely digital on-chip circuit for local-random-variability measurement

Digest of Technical Papers - IEEE International Solid-State Circuits Conference

Volumn 51, Issue , 2008, Pages 412-623

  Rao, Rahul ^a   Jenkins, Keith A ^a   Kim, Jae Joon ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

TIMING CIRCUITS;

ALL DIGITAL; ON CHIPS; ON-CHIP CIRCUITS; RANDOM VARIABILITY; RANDOM VARIATION; STACKED CONFIGURATION; VOLTAGE-TO-FREQUENCY CONVERTERS;

FREQUENCY CONVERTER CIRCUITS;

EID: 49549118719     PISSN: 01936530     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISSCC.2008.4523232     Document Type: Conference Paper

References (8)

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2. A. Bhavnagarwala, D. Frank, S. Kosonocky "Circuits and Methods for Characterizing Random Variations in Device Characteristics in Semiconductor Integrated Circuits," US patent 20050043908, Feb, 2005.
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8. S. Mukhopadhyay, K. Kim, K. Jenkins et al, "Statistical Characterization and On-Chip Measurement Methods for Local Random Variability of a Process Using Sense-Amplifier Based Test-Structure", ISSSC Dig. Tech. Papers, Feb. pp. 400-401, 2007.