A test-structure to efficiently study threshold-voltage variation in large MOSFET arrays

Proceedings - Eighth International Symposium on Quality Electronic Design, ISQED 2007

Volumn , Issue , 2007, Pages 281-286

  Drego, Nigel ^a   Chandrakasan, Anantha ^a   Boning, Duane ^a  

^a Massachusetts Institute of Technology Cambridge

Author keywords

[No Author keywords available]

Indexed keywords

ACCESS CONTROL; ANALOG TO DIGITAL CONVERSION; COMPUTER SIMULATION; DIGITAL CONTROL SYSTEMS; HIERARCHICAL SYSTEMS; LOGIC DESIGN; MOSFET DEVICES;

DEVICES UNDER TEST (DUT); DIGITAL CONTROL LOGIC; SPICE SIMULATIONS;

THRESHOLD VOLTAGE;

EID: 34548131042     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISQED.2007.24     Document Type: Conference Paper

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