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Volumn , Issue , 2004, Pages 33-38

Characterization of MOS transistor current mismatch

Author keywords

Analog design; Compact models; Matching; Mismatch; MOSFET

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; DIGITAL CIRCUITS; ELECTRIC CURRENTS; ELECTRON DEVICES; STRAIN;

EID: 14244252596     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1016568.1016585     Document Type: Conference Paper
Times cited : (9)

References (18)
  • 1
    • 0021586347 scopus 로고
    • Random error effects in matched MOS capacitors and current sources
    • Dec.
    • J-B Shyu, G. C. Ternes, and F. Krummenacher, "Random error effects in matched MOS capacitors and current sources", IEEE J. Solid-State Circuits, vol. 19, no. 6, pp. 948-955, Dec. 1984.
    • (1984) IEEE J. Solid-state Circuits , vol.19 , Issue.6 , pp. 948-955
    • Shyu, J.-B.1    Ternes, G.C.2    Krummenacher, F.3
  • 3
    • 0028369135 scopus 로고
    • Measurements of MOS current mismatch in the weak inversion region
    • Feb.
    • F. Forti and M. E. Wright, "Measurements of MOS current mismatch in the weak inversion region", IEEE J. Solid-State Circuits, vol. 29, no. 2, pp. 138-142, Feb. 1994.
    • (1994) IEEE J. Solid-state Circuits , vol.29 , Issue.2 , pp. 138-142
    • Forti, F.1    Wright, M.E.2
  • 4
    • 0037346346 scopus 로고    scopus 로고
    • Understanding MOSFET mismatch for analog design
    • Mar.
    • P. G. Drennan, and C. C. McAndrew, "Understanding MOSFET mismatch for analog design", IEEE J. Solid-State Circuits, vol. 38, no. 3, pp. 450-456, Mar. 2003.
    • (2003) IEEE J. Solid-state Circuits , vol.38 , Issue.3 , pp. 450-456
    • Drennan, P.G.1    McAndrew, C.C.2
  • 6
    • 0242332714 scopus 로고    scopus 로고
    • Current mismatch due to local dopant fluctuations in MOSFET channel
    • Nov.
    • H. Yang et al., "Current mismatch due to local dopant fluctuations in MOSFET channel", IEEE Trans. Electron Devices, vol. 50, no. 11, pp. 2248-2254, Nov. 2003.
    • (2003) IEEE Trans. Electron Devices , vol.50 , Issue.11 , pp. 2248-2254
    • Yang, H.1
  • 10
    • 0002808741 scopus 로고    scopus 로고
    • Current-based MOSFET model for integrated circuit design
    • Chapter 2 edited by E. Sánchez-Sinencio and A. Andreou, New Jersey: IEEE Press
    • Current-Based MOSFET Model for Integrated Circuit Design", Chapter 2 in Low-Voltage/Low-Power Integrated Circuits and Systems, edited by E. Sánchez-Sinencio and A. Andreou, New Jersey: IEEE Press, 1998.
    • (1998) Low-voltage/Low-power Integrated Circuits and Systems
  • 13
    • 0030084540 scopus 로고    scopus 로고
    • Influence of statistical spacial-nonunifirmity of dopant atoms on threshold voltage in a system of many MOSFETs
    • T. Mizuno, "Influence of statistical spacial-nonunifirmity of dopant atoms on threshold voltage in a system of many MOSFETs", Jpn. J. Appl. Phys., vol. 35, pp. 842-848, 1996.
    • (1996) Jpn. J. Appl. Phys. , vol.35 , pp. 842-848
    • Mizuno, T.1
  • 15
    • 0031188590 scopus 로고    scopus 로고
    • CMOS technology for mixed signal ICs
    • July
    • M. Pelgrom and M. Vertragt, "CMOS technology for mixed signal ICs", Solid-State Electronics, vol. 41, no. 7, pp. 967-974, July 1997.
    • (1997) Solid-state Electronics , vol.41 , Issue.7 , pp. 967-974
    • Pelgrom, M.1    Vertragt, M.2
  • 16
    • 0028513902 scopus 로고
    • Threshold voltage mismatch in short-channel MOS transistors
    • Sept.
    • M. Steyaert et al., "Threshold voltage mismatch in short-channel MOS transistors", Electronics Letters, vol. 30, no. 18, pp. 1546-1548, Sept. 1994.
    • (1994) Electronics Letters , vol.30 , Issue.18 , pp. 1546-1548
    • Steyaert, M.1
  • 17
  • 18
    • 0042527394 scopus 로고    scopus 로고
    • A compact model for flicker noise in MOS transistors for analog circuit design
    • Aug.
    • A. Amaud and C. Galup-Montoro, "A compact model for flicker noise in MOS transistors for analog circuit design", IEEE Trans. Electron Devices, vol. 50, no. 8, pp. 1815-1818, Aug. 2003.
    • (2003) IEEE Trans. Electron Devices , vol.50 , Issue.8 , pp. 1815-1818
    • Amaud, A.1    Galup-Montoro, C.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.