-
1
-
-
0021586347
-
Random error effects in matched MOS capacitors and current sources
-
Dec.
-
J-B Shyu, G. C. Ternes, and F. Krummenacher, "Random error effects in matched MOS capacitors and current sources", IEEE J. Solid-State Circuits, vol. 19, no. 6, pp. 948-955, Dec. 1984.
-
(1984)
IEEE J. Solid-state Circuits
, vol.19
, Issue.6
, pp. 948-955
-
-
Shyu, J.-B.1
Ternes, G.C.2
Krummenacher, F.3
-
2
-
-
0024754187
-
Matching properties of MOS transistors
-
Oct.
-
M. J. M. Pelgrom, A. C. J. Duinmaijer, and A. P. G. Welbers, "Matching properties of MOS transistors", IEEE J. Solid-State Circuits, vol. 24, no. 5, pp. 1433-1440, Oct. 1989.
-
(1989)
IEEE J. Solid-state Circuits
, vol.24
, Issue.5
, pp. 1433-1440
-
-
Pelgrom, M.J.M.1
Duinmaijer, A.C.J.2
Welbers, A.P.G.3
-
3
-
-
0028369135
-
Measurements of MOS current mismatch in the weak inversion region
-
Feb.
-
F. Forti and M. E. Wright, "Measurements of MOS current mismatch in the weak inversion region", IEEE J. Solid-State Circuits, vol. 29, no. 2, pp. 138-142, Feb. 1994.
-
(1994)
IEEE J. Solid-state Circuits
, vol.29
, Issue.2
, pp. 138-142
-
-
Forti, F.1
Wright, M.E.2
-
4
-
-
0037346346
-
Understanding MOSFET mismatch for analog design
-
Mar.
-
P. G. Drennan, and C. C. McAndrew, "Understanding MOSFET mismatch for analog design", IEEE J. Solid-State Circuits, vol. 38, no. 3, pp. 450-456, Mar. 2003.
-
(2003)
IEEE J. Solid-state Circuits
, vol.38
, Issue.3
, pp. 450-456
-
-
Drennan, P.G.1
McAndrew, C.C.2
-
6
-
-
0242332714
-
Current mismatch due to local dopant fluctuations in MOSFET channel
-
Nov.
-
H. Yang et al., "Current mismatch due to local dopant fluctuations in MOSFET channel", IEEE Trans. Electron Devices, vol. 50, no. 11, pp. 2248-2254, Nov. 2003.
-
(2003)
IEEE Trans. Electron Devices
, vol.50
, Issue.11
, pp. 2248-2254
-
-
Yang, H.1
-
7
-
-
14244268645
-
Self-consistent models of DC, AC, noise and mismatch for the MOSFET
-
C. Galup-Montoro, M. C. Schneider, A. Arnaud and H. Klimach, "Self-consistent models of DC, AC, noise and mismatch for the MOSFET", Proc. 2004 Nanotechnology Conference and Trade Show, pp. 494-499, 2004.
-
(2004)
Proc. 2004 Nanotechnology Conference and Trade Show
, pp. 494-499
-
-
Galup-Montoro, C.1
Schneider, M.C.2
Arnaud, A.3
Klimach, H.4
-
9
-
-
0032188612
-
An MOS transistor model for analog circuit design
-
Oct.
-
A. I. A. Cunha, M. C. Schneider, C. Galup-Montoro, "An MOS transistor model for analog circuit design", IEEE J. Solid-State Circuits, vol.33, no.10, pp.1510-1519, Oct. 1998.
-
(1998)
IEEE J. Solid-state Circuits
, vol.33
, Issue.10
, pp. 1510-1519
-
-
Cunha, A.I.A.1
Schneider, M.C.2
Galup-Montoro, C.3
-
10
-
-
0002808741
-
Current-based MOSFET model for integrated circuit design
-
Chapter 2 edited by E. Sánchez-Sinencio and A. Andreou, New Jersey: IEEE Press
-
Current-Based MOSFET Model for Integrated Circuit Design", Chapter 2 in Low-Voltage/Low-Power Integrated Circuits and Systems, edited by E. Sánchez-Sinencio and A. Andreou, New Jersey: IEEE Press, 1998.
-
(1998)
Low-voltage/Low-power Integrated Circuits and Systems
-
-
-
13
-
-
0030084540
-
Influence of statistical spacial-nonunifirmity of dopant atoms on threshold voltage in a system of many MOSFETs
-
T. Mizuno, "Influence of statistical spacial-nonunifirmity of dopant atoms on threshold voltage in a system of many MOSFETs", Jpn. J. Appl. Phys., vol. 35, pp. 842-848, 1996.
-
(1996)
Jpn. J. Appl. Phys.
, vol.35
, pp. 842-848
-
-
Mizuno, T.1
-
15
-
-
0031188590
-
CMOS technology for mixed signal ICs
-
July
-
M. Pelgrom and M. Vertragt, "CMOS technology for mixed signal ICs", Solid-State Electronics, vol. 41, no. 7, pp. 967-974, July 1997.
-
(1997)
Solid-state Electronics
, vol.41
, Issue.7
, pp. 967-974
-
-
Pelgrom, M.1
Vertragt, M.2
-
16
-
-
0028513902
-
Threshold voltage mismatch in short-channel MOS transistors
-
Sept.
-
M. Steyaert et al., "Threshold voltage mismatch in short-channel MOS transistors", Electronics Letters, vol. 30, no. 18, pp. 1546-1548, Sept. 1994.
-
(1994)
Electronics Letters
, vol.30
, Issue.18
, pp. 1546-1548
-
-
Steyaert, M.1
-
17
-
-
0038642443
-
Impact of grain number fluctuations in the MOS transistor gate on matching performance
-
R. Difrenza et al., "Impact of grain number fluctuations in the MOS transistor gate on matching performance", Proc. IEEE 2003 Int. Conference on Microelectronic Test Structures, pp. 244-249, 2003.
-
(2003)
Proc. IEEE 2003 Int. Conference on Microelectronic Test Structures
, pp. 244-249
-
-
Difrenza, R.1
-
18
-
-
0042527394
-
A compact model for flicker noise in MOS transistors for analog circuit design
-
Aug.
-
A. Amaud and C. Galup-Montoro, "A compact model for flicker noise in MOS transistors for analog circuit design", IEEE Trans. Electron Devices, vol. 50, no. 8, pp. 1815-1818, Aug. 2003.
-
(2003)
IEEE Trans. Electron Devices
, vol.50
, Issue.8
, pp. 1815-1818
-
-
Amaud, A.1
Galup-Montoro, C.2
|