Ring oscillator based technique for measuring variability statistics

IEEE International Conference on Microelectronic Test Structures

Volumn 2006, Issue , 2006, Pages 87-92

  Bhushan, Manjul ^a   Ketchen, Mark B ^b   Polonsky, Stas ^b   Gattiker, Anne ^c  

^a IBM   (United States)

^b IBM T J WATSON RESEARCH CENTER   (United States)

^c IBM AUSTIN RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FREQUENCY PARAMETERS; FREQUENCY VARIATIONS; RANDOM VARIATIONS; RING OSCILLATORS;

MOSFET DEVICES; NATURAL FREQUENCIES; PARAMETER ESTIMATION; SIGNAL PROCESSING; STATISTICAL METHODS; THRESHOLD VOLTAGE;

OSCILLATORS (ELECTRONIC);

EID: 33747070284     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICMTS.2006.1614281     Document Type: Conference Paper

References (8)

1. Asen Asenov, Andrew R. Brown, John H. Davies Savas Kaya and Gabriela Slavcheva, IEEE Trans. Electron Devices, Vol. 50, 1838, 2003.
2. Kazuo Terada, Masatomo Eimitsu, Proceedings of ICMTS 2003, pp. 227-231.
3. Kazuo Terada, Masatomo Eimitsu and Kouhei Fukeda, Proceedings of ICMTS 2005, pp. 165-169.
4. Mark Ketchen, Manjul Bhushan, and Dale Pearson, Proceedings of 2005 ICMTS, pp. 33-38.
5. Mark B. Ketchen, Manjul Bhushan, and Keith Jenkins, 2005 IEEE International SOI Conference Proceedings, pp. 77-78.
6. D.J. Frank, ISSCC 2004 Microprocessor Circuit Design Forum, Managing Variability in sub-100nm designs, February, 2004, San Fransisco.
7. R. Difrenza, K. Rochereau, T. Devoivre, B. Tavel, B. Duiez, D. Roy, S. Jullian, A. Dezzani, R. Boulestin, P. Stolk, F. Arnaud, Proceedings of ICMTS 2005, pp. 137-142.
8. Ulrich Schaper, Jan Einfeld, and Anke Sauerbrey, Proceedings of ICMTS 2005, pp. 137-142.