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Volumn 17, Issue 7-10, 2008, Pages 1248-1251
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Integration of diamond in fully-depleted silicon-on-insulator technology as buried insulator: A theoretical analysis
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Author keywords
Diamond properties and applications; Electrical properties; Silicon on insulator (SOI); Thermal properties
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Indexed keywords
DIAMOND FILMS;
DIAMONDS;
ELECTRIC NETWORK ANALYSIS;
MICROSENSORS;
NONMETALS;
SILICA;
SILICON COMPOUNDS;
DIAMOND PROPERTIES AND APPLICATIONS;
ELECTRICAL PROPERTIES;
ELECTRO-THERMAL SIMULATIONS;
FULLY DEPLETED SILICON-ON-INSULATOR;
FULLY-DEPLETED;
SILICON DIOXIDES;
SILICON-ON-INSULATOR (SOI);
SILICON-ON-INSULATOR SUBSTRATES;
TECHNOLOGICAL WORK;
THEORETICAL ANALYSIS;
THERMAL PROPERTIES;
THIN DIAMOND FILMS;
SILICON ON INSULATOR TECHNOLOGY;
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EID: 48849105415
PISSN: 09259635
EISSN: None
Source Type: Journal
DOI: 10.1016/j.diamond.2008.03.026 Document Type: Article |
Times cited : (11)
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References (22)
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