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Volumn 17, Issue 7-10, 2008, Pages 1045-1050
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Transmission electron microscopy study of the very early stages of diamond growth on iridium
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Author keywords
Bias enhanced nucleation; Heteroepitaxy; Iridium; Transmission electron microscopy
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Indexed keywords
AMORPHOUS CARBON;
CARBON;
CRYSTALLOGRAPHY;
DIAMONDS;
ELECTRON DIFFRACTION;
ELECTRON MICROSCOPES;
EPITAXIAL GROWTH;
HIGH ENERGY ELECTRON DIFFRACTION;
HIGH RESOLUTION ELECTRON MICROSCOPY;
ION BOMBARDMENT;
IRIDIUM;
MATERIALS SCIENCE;
NANOSTRUCTURED MATERIALS;
REFLECTION HIGH ENERGY ELECTRON DIFFRACTION;
AMORPHOUS CARBON LAYERS;
BEN PROCESS;
BIAS ENHANCED NUCLEATION;
BIASING CONDITIONS;
CARBON COVERAGE;
CARBON PRECURSORS;
DIAMOND CRYSTALS;
DIAMOND GROWTH;
EARLY STAGES;
GROWTH STEPS;
HETEROEPITAXY;
PRECURSOR PHASE;
RAPID ETCHING;
TRANSMISSION ELECTRON;
TRANSMISSION ELECTRON MICROSCOPY;
HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;
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EID: 48849104213
PISSN: 09259635
EISSN: None
Source Type: Journal
DOI: 10.1016/j.diamond.2008.01.115 Document Type: Article |
Times cited : (34)
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References (17)
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