Evolution of combinatorial and sequential online self-diagnosing hardware

Proceedings - NASA/DoD Conference on Evolvable Hardware, EH

Volumn 2003-January, Issue , 2003, Pages 167-173

  Garvie, M ^a   Thompson, A ^a  

^a UNIVERSITY OF SUSSEX   (United Kingdom)

Author keywords

Adders; Built in self test; Circuit faults; Circuit testing; Genetic algorithms; Genetic mutations; Hardware; Logic circuits; Logic testing; Test pattern generators

Indexed keywords

ADDERS; COMPUTER CIRCUITS; COMPUTER HARDWARE; GENETIC ALGORITHMS; LOGIC CIRCUITS; NASA;

CIRCUIT FAULTS; CIRCUIT TESTING; GENETIC MUTATIONS; LOGIC TESTING; TEST PATTERN GENERATOR;

BUILT-IN SELF TEST;

EID: 48849086870     PISSN: 15506029     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EH.2003.1217663     Document Type: Conference Paper

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