Theoretical properties of LFSRs for built-in self test

Integration, the VLSI Journal

Volumn 25, Issue 1, 1998, Pages 17-35

  Dufaza, Christian ^a  

^a UNIV MONTPELLIER   (France)

Author keywords

Built in self test; Hardware test pattern generator; Linear feedback shift register

Indexed keywords

ERROR CORRECTION; ERROR DETECTION; FEEDBACK; SHIFT REGISTERS;

LINEAR FEEDBACK SHIFT REGISTERS;

BUILT-IN SELF TEST;

EID: 0032155868     PISSN: 01679260     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-9260(98)00005-4     Document Type: Article

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