-
4
-
-
0346298694
-
Built-in self-test techniques: Techniques, attributes and selection
-
H.T. Mouftah and S.M. Adhem, Built-in self-test techniques: techniques, attributes and selection, J. Semi-custom ICs, 8(3) (1991) 3-11.
-
(1991)
J. Semi-custom ICs
, vol.8
, Issue.3
, pp. 3-11
-
-
Mouftah, H.T.1
Adhem, S.M.2
-
5
-
-
0026929001
-
Estimating testing effectiveness of the circular self-test path technique
-
A. Krasniewski, S. Pilarski and T. Kameda, Estimating testing effectiveness of the circular self-test path technique, IEEE Trans. Computer-aided Design, 11(10) (1992) 1301-1316.
-
(1992)
IEEE Trans. Computer-aided Design
, vol.11
, Issue.10
, pp. 1301-1316
-
-
Krasniewski, A.1
Pilarski, S.2
Kameda, T.3
-
7
-
-
0347559907
-
An experimental analysis of the effectiveness of the circular self-test path technique
-
Sept.
-
F. Corno, P. Prinetto and M.S. Reorda, An experimental analysis of the effectiveness of the circular self-test path technique, ACM, Sept. 1991, pp. 1075-1081.
-
(1991)
ACM
, pp. 1075-1081
-
-
Corno, F.1
Prinetto, P.2
Reorda, M.S.3
-
9
-
-
0025404497
-
Self-test support in the IBM engineering design system
-
B.K. Keller and T.J. Snethen, Self-test support in the IBM engineering design system, IBM J. Research and Development, 34(2-3) (1990) 406-415.
-
(1990)
IBM J. Research and Development
, vol.34
, Issue.2-3
, pp. 406-415
-
-
Keller, B.K.1
Snethen, T.J.2
-
10
-
-
0347559905
-
Analysis of detection capability of parallel signature analyzers
-
B. Jin, Y.K. Malaiya and Y. Min, Analysis of detection capability of parallel signature analyzers, IEEE Trans. on Computers, 40(9) (1991) 1075-1081.
-
(1991)
IEEE Trans. on Computers
, vol.40
, Issue.9
, pp. 1075-1081
-
-
Jin, B.1
Malaiya, Y.K.2
Min, Y.3
-
14
-
-
0024865354
-
Aliasing errors in multiple input signature analysis registers
-
March
-
T.W. Williams and W. Daehn, Aliasing errors in multiple input signature analysis registers, Proc. 1st European Test Conf., March 1989, pp. 338-345.
-
(1989)
Proc. 1st European Test Conf.
, pp. 338-345
-
-
Williams, T.W.1
Daehn, W.2
-
15
-
-
0025590418
-
Aliasing in signature analysis testing with multiple-input shift-registers
-
B. Ricco, P. Olivo and M. Favalli, Aliasing in signature analysis testing with multiple-input shift-registers, IEEE Trans. Computer-aided Design, CAD-9(12) (1990) 1344-1353.
-
(1990)
IEEE Trans. Computer-aided Design
, vol.CAD-9
, Issue.12
, pp. 1344-1353
-
-
Ricco, B.1
Olivo, P.2
Favalli, M.3
-
16
-
-
0023593474
-
On a fast method to monitor the behaviour of signature analysis registers
-
Feb.
-
A. Ivanov and V. Agarwal, On a fast method to monitor the behaviour of signature analysis registers, in Proc. IEEE International Test Conf., Feb. 1987, pp. 645-655.
-
(1987)
Proc. IEEE International Test Conf.
, pp. 645-655
-
-
Ivanov, A.1
Agarwal, V.2
-
17
-
-
0026187825
-
Aliasing probabilities for feedback signature compression of test data
-
J.P. Robison, Aliasing probabilities for feedback signature compression of test data, IEEE Trans. on Computers, 40(7) (1991) 867-873.
-
(1991)
IEEE Trans. on Computers
, vol.40
, Issue.7
, pp. 867-873
-
-
Robison, J.P.1
-
20
-
-
0022985074
-
Modular built-in testprocessor for future VLSI chips
-
April
-
A. Hunger, V. Blaschke and W. Budde, Modular built-in testprocessor for future VLSI chips, 7th European Conf. on Electrotechnics, Eurocon '86, April 1986, pp. 469-475.
-
(1986)
7th European Conf. on Electrotechnics, Eurocon '86
, pp. 469-475
-
-
Hunger, A.1
Blaschke, V.2
Budde, W.3
|