Reverse-magnetic-field reciprocity in conductive samples with extended contacts

Journal of Applied Physics

Volumn 104, Issue 2, 2008, Pages

  Cornils, Martin ^a   Paul, Oliver ^a  

^a UNIVERSITY OF FREIBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE COUPLED DEVICES; FIELD EFFECT TRANSISTORS; LOGIC CIRCUITS; MAGNETIC FIELD MEASUREMENT; MAGNETIC FIELDS; METALLIC COMPOUNDS; METALS; MOS DEVICES; SEMICONDUCTOR MATERIALS; STRUCTURAL METALS;

ARBITRARY SHAPES; COMPLEMENTARY METAL OXIDE SEMICONDUCTORS; CONDUCTIVITY TENSORS; CONTACT STRUCTURES; CONTACT SWITCHING; LINEAR DEVICES; MAGNETIC FIELD REVERSAL; MAGNETIC SENSORS; ONSAGER; REAL DEVICES; RESISTANCE MEASUREMENTS; TEST STRUCTURES;

MAGNETIC MATERIALS;

EID: 48849084699     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2951895     Document Type: Article

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