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Volumn , Issue , 2007, Pages 1259-1262

Sensor calibration of planar four-contact devices with up to two extended contacts

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; ELECTRIC RESISTANCE; PAPER SHEETING;

EID: 48349130262     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICSENS.2007.4388638     Document Type: Conference Paper
Times cited : (2)

References (9)
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    • (1978) J. Electrochem. Soc , vol.125 , Issue.4 , pp. 645-650
    • Buehler, M.G.1    Thurber, W.R.2
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    • Hall-Effect Devices
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    • R. S. Popovic, "Hall-Effect Devices", Sensors and Actuators, vol. 17, no. 1, pp. 39-53, May 1989.
    • (1989) Sensors and Actuators , vol.17 , Issue.1 , pp. 39-53
    • Popovic, R.S.1
  • 5
    • 33645139629 scopus 로고    scopus 로고
    • The van der Pauw stress sensor
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    • A. Mian, J. C. Suhling, and R. C. Jaeger, "The van der Pauw stress sensor", IEEE Sensors J., vol. 6, no. 2, pp. 340-356, April 2006.
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  • 6
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    • Effect of contact size and placement, and of resistive inhomogenities on van der Pauw measurements
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    • Koon, D.W.1
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    • 4th ed, Springer-Verlag, New York, Chapter X
    • S. Lang, "Complex Analysis", 4th ed., Springer-Verlag, New York 1999, Chapter X.
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    • 3rd ed, John Wiley & Sons, Inc, New York, Chapter 2
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  • 9
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.