Electrostatic forces and micromanipulator design: On the importance of surface topography parameters

IEEE/ASME International Conference on Advanced Intelligent Mechatronics, AIM

Volumn , Issue , 2007, Pages

  Sausse Lhernould, Marion ^a   Delchambre, Alain ^a   Régnier, Stéphane ^b   Lambert, Pierre ^a  

^a UNIVERSITÉ LIBRE DE BRUXELLES   (Belgium)

^b UNIVERSITÉ PIERRE ET MARIE CURIE   (France)

Author keywords

Adhesion; Electrostatic forces; Fractals; Roughness

Indexed keywords

ASYMPTOTIC ANALYSIS; ELECTRONICS INDUSTRY; ELECTROSTATIC DEVICES; ELECTROSTATIC FORCE; ELECTROSTATICS; ENGINEERING GEOLOGY; FRACTALS; MACHINE VIBRATIONS; MECHATRONICS; MICROMANIPULATORS; OPTICAL DESIGN; SEPARATION; SURFACE ROUGHNESS; SURFACES; VAN DER WAALS FORCES;

ADHESION; ANALYTICAL MODELLING; ELECTROSTATIC FORCES; FABRICATION PROCESSES; INTELLIGENT MECHATRONICS; INTERNATIONAL CONFERENCES; MICRO MANIPULATIONS; ROUGH SURFACES; ROUGHNESS; SEPARATION DISTANCES; SIMULATION TOOLS; SMOOTH SURFACES; SURFACE CONTAMINATIONS; SURFACE FORCING; SURFACE TREATMENTS; VAN DER WAALS; WEIERSTRASS-MANDELBROT FUNCTIONS;

SURFACE TOPOGRAPHY;

EID: 48649091849     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/AIM.2007.4412433     Document Type: Conference Paper

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