Impact of bias condition on 1/f noise of dual-gate depletion type MOSFET in linear region and consequences for noise diagnostic application and modelling

Microelectronics Reliability

Volumn 48, Issue 7, 2008, Pages 1008-1014

  Videnovic Misic, M ^a   Jevtic, M M ^b  

^a UNIVERSITY OF NOVI SAD   (Serbia)

^b UNIVERSITY OF BELGRADE   (Serbia)

Author keywords

[No Author keywords available]

Indexed keywords

EIGENVALUES AND EIGENFUNCTIONS; HEALTH;

1 / F NOISE; GATE DEPLETION; LINEAR REGIONS; NUMERICA L RESULTS;

MOSFET DEVICES;

EID: 48349112293     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2008.04.002     Document Type: Article

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