Structural, electrical, and photoconductive properties of individual single-crystalline tellurium nanotubes synthesized by a chemical route: Doping effects on electrical structure

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Volumn 4, Issue 7, 2008, Pages 888-893

  Xu, Weihong ^a   Song, Jiming ^a   Sun, Lian ^b   Yang, Jinlong ^b   Hu, Wenping ^c   Ji, Zhuoyu ^c   Yu, Shu Hong ^a  

^a UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

^b UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

^c INSTITUTE OF CHEMISTRY   (China)

Author keywords

Density functional calculations; Doping; Nanotubes; Tellurium

Indexed keywords

CHEMICAL PROPERTIES; CRYSTAL GROWTH; CRYSTALLINE MATERIALS; ELECTRIC CONDUCTIVITY; ELECTRIC PROPERTIES; GRAIN BOUNDARIES; HEALTH; NANOPORES; NANOSTRUCTURED MATERIALS; NANOSTRUCTURES; NANOTUBES; NONMETALS; PHOTOCONDUCTIVITY; PLATINUM; POWDERS; SEMICONDUCTOR GROWTH; SYNTHESIS (CHEMICAL); TELLURIUM;

BAND GAPS; CHEMICAL ROUTES; CHEMICAL SOLUTIONS; DEPOSITION TECHNIQUES; DOPING EFFECTS; ELECTRICAL (ELECTRONIC) PROPERTIES; ELECTRICAL RESISTANCES; ELECTRICAL STRUCTURES; FOCUSED ION BEAM (FEB); INDIVIDUAL (PSS 544-7); NANO TUBE; PHOTOCONDUCTIVE PROPERTIES; POTENTIAL DROP; SINGLE-CRYSTALLINE; TELLURIUM NANOTUBES; TEMPERATURE RANGES;

SEMICONDUCTING TELLURIUM;

CARBON NANOTUBE; METAL NANOPARTICLE; NANOTUBE; TELLURIUM;

ARTICLE; CHEMISTRY; CRYSTALLIZATION; ELECTROCHEMISTRY; LIGHT; MATERIALS TESTING; METHODOLOGY; NANOTECHNOLOGY; PHOTOCHEMISTRY; SURFACE PROPERTY; TEMPERATURE; X RAY DIFFRACTION;

CRYSTALLIZATION; ELECTROCHEMISTRY; LIGHT; MATERIALS TESTING; METAL NANOPARTICLES; NANOTECHNOLOGY; NANOTUBES; NANOTUBES, CARBON; PHOTOCHEMISTRY; SURFACE PROPERTIES; TELLURIUM; TEMPERATURE; X-RAY DIFFRACTION;

EID: 48249095007     PISSN: 16136810     EISSN: 16136829     Source Type: Journal    
DOI: 10.1002/smll.200701227     Document Type: Article

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