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Volumn 111, Issue 32, 2007, Pages 12112-12115

Thermal stability of carbon-nanotube-based field emission diodes

Author keywords

[No Author keywords available]

Indexed keywords

FIELD EMISSION; LEAKAGE CURRENTS; SEMICONDUCTOR DIODES; THERMODYNAMIC STABILITY;

EID: 34548220624     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp074081y     Document Type: Article
Times cited : (10)

References (27)
  • 26
    • 34548269740 scopus 로고    scopus 로고
    • http://www.lakeshore.com/temp/sen/sd670_po.html.
  • 27
    • 34548283782 scopus 로고    scopus 로고
    • http://www.globalspec.com/FeaturedProducts/Detail/HVComponentsCKE/ High_Temperature_High_Voltage_Diodes/30995/0?frornSpotlight=1.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.