Synthesis and electrical characterization of silver nanobeams

Nano Letters

Volumn 6, Issue 10, 2006, Pages 2273-2278

  Wiley, Benjamin J ^a   Wang, Zenghui ^a   Wei, Jiang ^a   Yin, Yadong ^b   Cobden, David H ^a   Xia, Younan ^a  

^a UNIVERSITY OF WASHINGTON   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC ADDITION; CONDUCTION PATH; NANOBEAMS; RAPID CHARACTERIZATION;

CHARACTERIZATION; CURRENT DENSITY; ELECTRIC CONDUCTIVITY; ELECTRON TRANSPORT PROPERTIES; SILVER;

NANOSTRUCTURED MATERIALS;

NANOTUBE; SILVER;

ARTICLE; CHEMISTRY; CRYSTALLIZATION; ELECTRIC CONDUCTIVITY; ELECTROCHEMISTRY; MATERIALS TESTING; METHODOLOGY; PARTICLE SIZE; ULTRASTRUCTURE;

CRYSTALLIZATION; ELECTRIC CONDUCTIVITY; ELECTROCHEMISTRY; MATERIALS TESTING; NANOTUBES; PARTICLE SIZE; SILVER;

EID: 33750523415     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl061705n     Document Type: Article

References (23)

1. Whitesides, G. M.; Boncheva, M. Proc. Natl. Acad. Sci. U.S.A. 2002, 99, 4769.
2. Xia, Y.; Yang, P.; Sun, Y.; Wu, Y.; Mayers, B.; Gates, B.; Yin, Y.; Kim, F.; Yan, H. Adv. Mater. 2003, 15, 353.
3. Wiley, B.; Im, S.-H.; Li, Z.-Y.; McLellan, J.; Siekkinen, A.; Xia, Y. J. Phys. Chem B 2006, 110, 15666.
4. Carmon, F.; Barreau, F.; Delhaes, P.; Canet, R. J. Phys. Lett. 1980, 41, L-531.
5. Wiley, B.; Sun, Y.; Mayers, B.; Xia, Y. Chem. - Eur. J. 2005, 11, 454.
6. Smith, D. J.; Petford-Long, A. K.; Wallenberg, L. R.; Bovin, J. O. Science 1986, 233, 872.
7. Ajayan, P. M.; Marks, L. D. Phys. Rev. Lett. 1998, 60, 585.
8. Wiley, B.; Herricks, T.; Sun, Y.; Xia, Y. Nano Lett. 2004, 4, 1733.
9. Im, S.-H.; Lee, Y. T.; Wiley, B.; Xia, Y. Angew. Chem., Int. Ed. 2005, 44, 2154.
10. Wiley, B.; Sun, Y.; Xia, Y. Langmuir 2005, 21, 8077.
11. Wiley, B.; Xiong, Y.; Li, Z.-Y.; Xia, Y. Nano Lett. 2006, 6, 765.
12. Sun, Y.; Mayers, B.; Herricks, T.; Xia, Y. Nano Lett. 2003, 3, 955.
13. Chen, J.; Herricks, T.; Geissler, M.; Xia, Y. J. Am. Chem. Soc. 2004, 126, 10854.
14. Lofton, C.: Sigmund, W. Adv. Funct. Mater. 2005, 15, 1197.
15. Park, H.; Lim, A. K. L.; Alivisatos, A. P.: Park, J.; McEuen, P. L. Appl. Phys. Lett. 1999, 75, 301.
16. Dingle, R. B. Proc. R. Soc. London, Ser. A 1950, 201, 545.
17. Sondheimer, E. H. Adv. Phys. 1952, 1, 1.
18. Tsoi, V. S.; Bass, J.; Benistant, P. A.; van Kempen, H.; Payens, E. L. M.; Wyder, P. J. Phys. F: Metal Phys. 1979, 9, L221.
19. Tsoi, V. S.; Bass, J.; Wyder, P. Rev. Mod. Phys. 1999, 71, 1641.
20. Kim, S.; Suhl, H.: Schuller, I. K. Phys. Rev. Lett. 1997, 78, 332.
21. Bid, A.; Bora, A.; Raychaudhuri, A. K. Phys. Rev. B 2006, 74, 035426.
22. Bourlon, B.; Glattli, D. C.; Placais, B.; Berroir, J. M.; Milko, C.; Forro, L.: Bachtold, A. Phys. Rev. Lett. 2004, 92, 026804.
23. Wei, B. Q.; Vajtai, R.: Ajayan, P. M. App. Phys. Lett. 2001, 79, 1172.