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Volumn 310, Issue 16, 2008, Pages 3722-3725

Influence of growth rate in the early stage of high temperature GaN layer growth on quality of GaN films

Author keywords

A3. Metalorganic vapor phase epitaxy; B1. Nitrides; B2. Semiconducting III V materials

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHEMICAL VAPOR DEPOSITION; ECOLOGY; GALLIUM NITRIDE; GROWTH RATE; MICROSCOPIC EXAMINATION; SCANNING PROBE MICROSCOPY; SEMICONDUCTING GALLIUM; STAGES; STEEL ANALYSIS; X RAY DIFFRACTION ANALYSIS;

EID: 48049124546     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2008.05.055     Document Type: Article
Times cited : (15)

References (16)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.