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Volumn 310, Issue 16, 2008, Pages 3722-3725
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Influence of growth rate in the early stage of high temperature GaN layer growth on quality of GaN films
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Author keywords
A3. Metalorganic vapor phase epitaxy; B1. Nitrides; B2. Semiconducting III V materials
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CHEMICAL VAPOR DEPOSITION;
ECOLOGY;
GALLIUM NITRIDE;
GROWTH RATE;
MICROSCOPIC EXAMINATION;
SCANNING PROBE MICROSCOPY;
SEMICONDUCTING GALLIUM;
STAGES;
STEEL ANALYSIS;
X RAY DIFFRACTION ANALYSIS;
(PL) PROPERTIES;
ATOMIC FORCE (AF);
DOUBLE CRYSTAL X RAY DIFFRACTION (DC XRD);
ELSEVIER (CO);
GAN FILMS;
GAN GROWTH;
GAN LAYERS;
HIGH TEMPERATURE (HT);
LAYER GROWTH;
GALLIUM ALLOYS;
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EID: 48049124546
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jcrysgro.2008.05.055 Document Type: Article |
Times cited : (15)
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References (16)
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