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Volumn 75, Issue 15, 1999, Pages 2187-2189

Effects of growth temperature on GaN nucleation layers

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0001408312     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.124959     Document Type: Article
Times cited : (61)

References (12)
  • 12
    • 0003472812 scopus 로고
    • Addison-Wesley, Reading, MA, Chap 13
    • For general review on diffraction from systems with stacking faults, refer to B. E. Warren, X-Ray Diffraction (Addison-Wesley, Reading, MA, 1969), Chap 13.
    • (1969) X-Ray Diffraction
    • Warren, B.E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.