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Volumn , Issue , 2007, Pages

Modeling & measurement of mutual coupling resulting from via structures within printed circuit boards

Author keywords

3D PCB; Measurement; Modeling; Mutual coupling; Reflected impedance; Via

Indexed keywords

COPPER; ELECTRIC INVERTERS; ELECTROMAGNETIC COMPATIBILITY; ELECTROMAGNETIC WAVE EMISSION; ELECTROMAGNETISM; ELECTRONIC EQUIPMENT MANUFACTURE; INDUCTANCE; MAGNETIC FLUX; MAGNETIC MATERIALS; PLASTIC MOLDS; PRINTED CIRCUIT BOARDS; PRINTED CIRCUIT MANUFACTURE; PRINTED CIRCUITS;

EID: 47849120494     PISSN: 10774076     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISEMC.2007.117     Document Type: Conference Paper
Times cited : (5)

References (16)
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  • 3
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    • J Calvert, Coupled circuits, published by University of Denver, 2001
    • J Calvert, "Coupled circuits", published by University of Denver, 2001
  • 4
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    • nd edition. Page 4.58
    • nd edition. Page 4.58
  • 5
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    • Qizheng Gu, M Tassoudji, Soon Y. Poh, Robert T. Shin, and Jin Au Kong Coupled noise analysis for adjacent vias in multilayered digital circuits, IEEE Transactions on circuits and systems 41, No. 12 1994
    • Qizheng Gu, M Tassoudji, Soon Y. Poh, Robert T. Shin, and Jin Au Kong "Coupled noise analysis for adjacent vias in multilayered digital circuits", IEEE Transactions on circuits and systems Vol. 41, No. 12 1994
  • 6
    • 33747610416 scopus 로고    scopus 로고
    • Modeling and measurement of simultaneous switching noise coupling through signal via transition
    • Jongbae Park and Hyungsoo Kim etal. "Modeling and measurement of simultaneous switching noise coupling through signal via transition", IEEE Transactions on Advance Packaging, Vol. 29, No. 3, 2006
    • (2006) IEEE Transactions on Advance Packaging , vol.29 , Issue.3
    • Park, J.1    Kim, H.2
  • 7
    • 4644337940 scopus 로고    scopus 로고
    • Via coupling within power-return plane structures considering the radiation loss
    • Richard Chen, Ji Chen, Todd Hubing, and Weimin Shi "Via coupling within power-return plane structures considering the radiation loss", IEEE International EMC Symposium, 2004
    • (2004) IEEE International EMC Symposium
    • Chen, R.1    Chen, J.2    Hubing, T.3    Shi, W.4
  • 9
    • 0037596796 scopus 로고    scopus 로고
    • Resonance stub effect in a transition from a through via hole to a stripline in multilayer PCBs
    • Taras Kushta, Kaoru Narita, Tomoyuki Kaneko, Takanori Saeki, and Hirokazu Tohya "Resonance stub effect in a transition from a through via hole to a stripline in multilayer PCBs", IEEE Microwave and Wireless Components Letters, Vol. 13, No. 5, 2003
    • (2003) IEEE Microwave and Wireless Components Letters , vol.13 , Issue.5
    • Kushta, T.1    Narita, K.2    Kaneko, T.3    Saeki, T.4    Tohya, H.5
  • 10
    • 4644313884 scopus 로고    scopus 로고
    • Comparison of via equivalent circuit model accuracy using quasi-static and full-wave approaches
    • Bruce Archambeault and Samuel Connor et al. "Comparison of via equivalent circuit model accuracy using quasi-static and full-wave approaches", IEEE International EMC Symposium, 2004
    • (2004) IEEE International EMC Symposium
    • Archambeault, B.1    Connor, S.2
  • 15
    • 26444611870 scopus 로고    scopus 로고
    • 3D PCB architecture for next generation high speed interconnections
    • Emerald Group Publishing Limited
    • Joseph Fjelstad, Kevin Grundy, and Gary Yasumura "3D PCB architecture for next generation high speed interconnections", Circuit World (Emerald Group Publishing Limited), Vol. 31, No. 4, 2005
    • (2005) Circuit World , vol.31 , Issue.4
    • Fjelstad, J.1    Grundy, K.2    Yasumura, G.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.